Abstract-We introduce a new hardware/software platform for testing SRAM-based FPGAs under heavy-ion and neutron beams, capable of tracing the bit-flips in the configuration memory back to the physical resources affected in the FPGA. The validation was performed using, for the first time, the neutron source at the RAL-ISIS facility. The ISIS beam features a 1/E spectrum, which is similar to the terrestrial one with an acceleration between 10 7 and 10 8 in the energy range 10-100 MeV. The results gathered on Xilinx SRAM-based FPGAs are discussed in terms of cross section and circuit-level modifications.

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Flash-based FPGAs are more and more interesting for space applications because of their robustness against Single Event Upsets (SEUs) in configuration memory. However, as Single Event Effects (SEEs) are still a concern both for user memory and the configurable logic, accurate evaluations are needed to identify mitigation techniques for securing their use in space missions. In this paper the SEE sensitivity of circuits implemented in Flash-based FPGAs is evaluated with respect to the working frequency and different routing schemes. We outline different methodologies that can be used in order to characterize SEE sensitivity, using both heavy-ions radiation experiments and analytical approaches. Experimental results detail the contributions of different SEEs as a function of operating frequency and routing on a realistic circuit