We present Hall effect measurements on MnSi/Si(111) epilayers and find an anomalous Hall contribution that is significantly smaller than in bulk crystals, which enables the observation of an additional contribution to the anomalous signal previously overlooked in MnSi. Our measurements indicate the signal is not due to skyrmions in MnSi thin films, which are absent in out-of-plane fields, but rather are the result of scattering from the cone phase. The absence of magnetic contrast in the transmission electron microscopy (TEM) measurements are consistent with this interpretation. We provide a method to model TEM images of skyrmions lattices to determine the conditions necessary for their observation in other B20 epilayers with an anisotropy that is favourable to their formation.
We present a method for nanoscale thermal imaging of insulating thin films using atomic force microscopy (AFM), and we demonstrate its utility on VO2. We sweep the applied voltage V to a conducting AFM tip in contact mode and measure the local current I through the film. By fitting the IV curves to a Poole–Frenkel conduction model at low V, we calculate the local temperature with spatial resolution better than 50 nm using only fundamental constants and known film properties. Our thermometry technique enables local temperature measurement of any insulating film dominated by the Poole–Frenkel conduction mechanism and can be extended to insulators that display other conduction mechanisms.
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