En este trabajo, reportamos la caracterización de monocristales de Si(100) y GaSb(111) utilizando espectroscopia Raman y fotoacústica (principal interés) en configuración abierta y cerrada, para compuestos semiconductores III-V con estructura tipo zinc blenda, los espectros Raman generalmente muestran dos picos, un pico a baja frecuencia correspondiente a modos fononicos TO y un pico en alta frecuencia correspondiente a modos fononicos LO. Un fuerte pico es mostrado en la posición 226 cm−1 y uno un poco más débil en 237 cm−1, que son los modos TO y LO respectivamente, debido a la orientación cristalina del material. Con el fin de determinar la difusividad térmica de los materiales se utilizaron láseres con longitudes de onda de 650 nm y 535 nm. Los resultados de la difusividad térmica de los monocristales de Si y GaSb, obtenidos a partir del modelo de Rosencwaig y Gersho (RG) se analizaron en función de la orientación cristalográfica. Discutimos la recombinación no-radiativa que se origina en la superficie y en el volumen del cristal, que contribuye a la señal fotoacústica, en términos del tipo de celda y de la línea de excitación.
GaAs/In bilayers were prepared by RF Magnetron Sputtering in an Ar atmosphere on Si (100) substrates using high purity (95.95%) GaAs (100) and In targets. The growth temperatures were 300˚C and 580˚C for the high purity targets of In and GaAs, respectively. Three samples were prepared: the deposition time (t d ) for the GaAs layers was fixed to 30 minutes, while varied for the In layers from t d = 10, 15, and 20 minutes. The morphological and optical studies of the samples were made by means of Amplitude Modulation Atomic Force Microscopy (AM-AFM). In order to analyze and correlate surface morphology and alloy composition properties, the as-prepared samples were cleaved along the [001] direction and subsequently studied by AM-AFM-micrographs. From topographic images, a statistical study of the roughness and grain size was made. Additionally, cross sectional AM-AFM-micrographs were performed for each sample, where the phase channel, which is sensitive to the material properties of the specimen, was of particular interest.
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