SUMMARYThis article presents a low quiescent current output-capacitorless quasi-digital complementary metal-oxidesemiconductor (CMOS) low-dropout (LDO) voltage regulator with controlled pass transistors according to load demands. The pass transistor of the LDO is segmented into two smaller sizes based on a proposed segmentation criterion, which considers the maximum output voltage transient variations due to the load transient to different load current steps to find the suitable current boundary for segmentation. This criterion shows that low load conditions will cause more output variations and settling time if the pass transistor is used in its maximum size. Furthermore, this situation is the worst case for stability requirements of the LDO. Therefore, using one smaller transistor for low load currents and another one larger for higher currents, a proper trade-off between output variations, complexity, and power dissipation is achieved. The proposed LDO regulator has been designed and post-simulated in HSPICE in a 0.18 μm CMOS process to supply a stable load current between 0 and 100 mA with a 40 pF on-chip output capacitor, while consuming 4.8 μA quiescent current. The dropout voltage of the LDO is set to 200 mV for 1.8 V input voltage. The results reveal an improvement of approximately 53% and 25% on the output voltage variations and settling time, respectively.
Abstract-A low quiescent current output-capacitorless CMOS LDO regulator based on a high slew-rate current-mode transconductance amplifier (CTA) as an error amplifier is presented. Load transient characteristic of the proposed LDO is improved even at low quiescent currents, by using a local common-mode feedback (LCMFB) in the proposed CTA. This provides an increase in the order of transfer characteristic of the circuit, thereby enhancing the slew-rate at the gate of pass transistor. The proposed CTA-based LDO topology has been designed and post-layout simulated in HSPICE, in a 0.18 µm CMOS process to supply a load current between 0-100 mA. Postlayout simulation results reveal that the proposed LDO is stable without any internal compensation strategy and with on-chip output capacitor or lumped parasitic capacitances at the output node between 10-100 pF.
Analog CMOS time-delay cells realized by passive components, e.g., lumped LC delay lines, are inefficient in terms of area for multi-GHz frequencies. All-pass filters considered as active circuits can, therefore, be the best candidates to approximate time delays. This paper proposes a broadband first-order voltage-mode all-pass filter as a true-time-delay cell. The proposed true-time-delay cell is capable of tuning delay, demonstrating its potential capability to be used in different systems, e.g., RF beam-formers. The proposed filter achieves a flat group delay of over 60 ps with a pole/zero pair located at 5 GHz. This proposed circuit consumes only 10 mW power from a 1.8-V supply. To demonstrate the performance of the proposed all-pass filter, simulation results are conducted by using Virtuoso Cadence in a standard TSMC 180-nm CMOS process.
This paper presents an output-capacitorless class-AB low-dropout (LDO) regulator with load current sinking and sourcing ability. The proposed LDO consists of two complementary pass transistors, controlled using a level shifter technique. The transient improvement section applied to the gates of the pass devices enhances the transient performance of the LDO. The proposed LDO is designed in TSMC 0.18 μm CMOS process with input and output voltages of 1.2-2.5 V and 1 V, respectively, 10 pF output capacitor, and quiescent current of 3.14 μA, and is capable to sink and source maximum load currents of ±100 mA, giving the current efficiency of 99.99%.
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