This paper presents a novel method to derive a Petri Net from any specification model that can be mapped into a statebased representation with arcs labeled with symbols from an alphabet of events (a Transition System, TS). The method is based on the theory of regions for Elementary Transition Systems (ETS). Previous work has shown that, for any ETS, there exists a Petri Net with minimum transition count (one transition for each label) with a reachability graph isomorphic to the original Transition System. Our method extends and implements that theory by using the following three mechanisms that provide a framework for synthesis of safe Petri Nets from arbitrary TSs. First, the requirement of isomorphism is relaxed to bisimulation of TSs, thus extending the class of synthesizable TSs to a new class called Excitation-Closed Transition Systems (ECTS). Second, for the first time, we propose a method of PN synthesis for an arbitrary TS based on mapping a TS event into a set of transition labels in a PN. Third, the notion of irredundant region set is exploited, to minimize the number of places in the net without affecting its behavior. The synthesis method can derive different classes of place-irredundant Petri Nets (e.g., pure, free choice, unique choice) from the same TS, depending on the constraints imposed on the synthesis algorithm. This method has been implemented and applied in different frameworks. The results obtained from the experiments have demonstrated the wide applicability of the method.
State assignment problems still need satisfactory solutions to make asynchronous circuit synthesis more practical. A well-known example of such a problem is that of complete state coding (CSC), which happens when a pair of different states in a specification has the same binary encoding. A standard way to approach state coding conflicts is to insert new state signals into the original specification in such a way that the original behavior remains intact. This paper proposes a method which improves over existing approaches by coupling generality, optimality, and efficiency. The method is based on the use of a class of "ground objects," called regions, that play the role of a bridge between statebased specifications (transition systems, TS's) and event-based specifications (signal transition graphs, STG's). We need to deal with both types of specification because designers usually prefer a timing diagram-like notation, such as STG, while optimization and cost analysis work better at the state level. A region in a transition system is a set of states that corresponds to a place in an STG (or the underlying Petri net). Regions are tightly connected with a set of properties that are to be preserved across the state encoding process, namely, 1) trace equivalence between the original and the encoded specification, and 2) implementability as a speed-independent circuit. We will build on a theoretical body of work that has shown the significance of regions for such property-preserving transformations, and describe a set of algorithms aimed at efficiently solving the encoding problem. The algorithms have been implemented in a software tool called petrify. Unlike many existing tools, petrify represents the encoded specification as an STG. This significantly improves the readability of the result (compared to a state-based description in which concurrency is represented implicitly by interleaving), and allows the designer to be more closely involved in the synthesis process. The efficiency of the method is demonstrated on a number of "difficult" examples.
As scaling becomes increasingly difficult, 3D integration has emerged as a viable alternative to achieve the requisite bandwidth and power efficiency challenges. However mechanical stress induced by the through silicon vias (TSV) is one of the key constraints in the 3D flow that must be controlled in order to preserve the integrity of front end devices. For the first time an extended and comprehensive study is given for the stress induced by single-and arrayed TSVs and its impact on both analog and digital FEOL devices and circuits. This work provides a complete experimental assessment and quantifies the stress distribution and its effect on front end devices. By using a combined experimental and theoretical approach we provide a framework that will enable stress aware design and the right definition of keep out zone and ultimately save valuable silicon area.
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