We present a Montecarlo simulator developed in Matlab® for the analysis of a Single Photon Avalanche Diode (SPAD)-based Complementary Metal-Oxide Semiconductor (CMOS) flash Light Detection and Ranging (LIDAR) system. The simulation environment has been developed to accurately model the components of a flash LIDAR system, such as illumination source, optics, and the architecture of the designated SPAD-based CMOS image sensor. Together with the modeling of the background noise and target topology, all of the fundamental factors that are involved in a typical LIDAR acquisition system have been included in order to predict the achievable system performance and verified with an existing sensor.
We present an FPGA implementation of a Timeto-Digital Converter based on a low cost, low area Spartan 6 device. The converter is based on a tapped delay line model. Several implementation details are discussed with particular focus on critical blocks such as the input stage and thermometerto-binary decoding techniques. We implemented a tap filtering technique to improve the differential non-linearity (DNL) of the single delay line while keeping a good LSB value of 25.57 ps with a single-shot precision (SSP) between 0.69 ÷ 1.46 LSB. Measured DNL and INL lie in the range between −0.90 ÷ 1.23 and −0.43 ÷ 2.96 LSB, respectively. We then implemented an interpolating TDC to overcome the limitations of a single delay line in terms of linearity and measurement range. The interpolating TDC uses the sliding scale technique, where the time interval to be measured is asynchronous with respect to the FPGA clock, achieving DNL and INL in the range −0.072 ÷ 0.070 and −0.755 ÷ 0.872 LSB. SSP is in the 1.096 ÷ 2.815 range. Moreover, we present a novel comparison between the DNLs obtained with two different methods: statistical code density test and using a finely-controlled delay source. Finally, we present the results of a Montecarlo simulation used to investigate the effects of non-linear propagation of the signal through the delay line.
We present an implementation of a semi-device-independent protocol of the generation of quantum random numbers in a fully integrated silicon chip. The system is based on a prepare-and-measure scheme, where we integrate a partially trusted source of photons and an untrusted single photon detector. The source is a silicon photomultiplier, which emits photons during the avalanche impact ionization process, while the detector is a single photon avalanche diode. The proposed protocol requires only a few and reasonable assumptions on the generated states. It is sufficient to measure the statistics of generation and detection in order to evaluate the min-entropy of the output sequence, conditioned on all possible classical side information. We demonstrate that this protocol, previously realized with a bulky laboratory setup, is totally applicable to a compact and fully integrated chip with an estimated throughput of 6 kHz of the certified quantum random bit rate.
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