The manner in which ultrathin films of alumina, deposited at the dielectric-electrode interface, affect the recoverable energy density associated with (BiFeO3)0.6–(SrTiO3)0.4 (BFST) thin film capacitors has been characterised. Approximately 6 nm of alumina on 400 nm of BFST increases the maximum recoverable energy of the system by around 30% from ∼13 Jcc−1 to ∼17 Jcc−1. Essentially, the alumina acts in the same way as a naturally present parasitic “dead-layer,” distorting the polarisation-field response such that the ultimate polarisation associated with the BFST is pushed to higher values of electric field. The work acts as a proof-of-principle to illustrate how the design of artificial interfacial dielectric “dead-layers” can increase energy densities in simple dielectric capacitors, allowing them to compete more generally with other energy storage technologies.

In ferroelectric tunnel junctions, the tunnel resistance depends on the polarization orientation of the ferroelectric tunnel barrier, giving rise to tunnel electroresistance. These devices are promising to be used as memristors in neuromorphic architectures and as non-volatile memory elements. For both applications device scalability is essential, which requires a clear understanding of the relationship between polarization reversal and resistance change as junction size shrinks. Here we show robust tunnel electroresistance in BiFeO 3 -based junctions with diameters ranging from 1200 to 180 nm. We demonstrate that the tunnel electroresistance and the corresponding fraction of reversed ferroelectric domains change 1 Electronic mail: vincent.garcia@thalesgroup.com 2 drastically with the junction diameter: while micron-size junctions display reversal in less than 10% of the area, the smallest junctions show an almost complete polarization reversal.Modeling the electric-field distribution, we highlight the critical role of the bottom electrode resistance which significantly diminishes the actual electric field applied to the ferroelectric barrier in the mixed polarization state. A polarization-dependent critical electric field below which further reversal is prohibited is found to explain the large differences between the ferroelectric switchability of nano-and micron-size junctions. Our results indicate that ferroelectric junctions are downscalable and suggest that specific junction shapes facilitate complete polarization reversal.Ferroelectric materials possess a spontaneous electrical polarization that is switchable by an external electric field. This enables the use of thin ferroelectric films sandwiched between electrodes as non-volatile memories.1 In such ferroelectric memories, the information is encoded by the polarization orientation and recovered in a destructive capacitive readout.When the thickness of the ferroelectric films is of the order of a few nanometers, electron tunneling becomes possible. In these ferroelectric tunnel junctions, 2,3 the tunnel resistance varies depending on the orientation of the polarization; this tunnel electroresistance effect enables a non-destructive information readout. These interfacial magnetoelectric coupling phenomena can be probed by tunnel magnetoresistance experiments, resulting in a non-volatile control of the spin-polarization. 26-29Moreover, selecting oxide electrodes subject to field-induced electronic phase transitions upon polarization reversal may result in enhanced tunnel electroresistance. 29,30 Hence, ferroelectric tunnel junctions offer a fantastic playground to explore electric-field-driven modifications at the nanoscale. 31 Top electrodes of Pt (10 nm) / Co (10 nm) with diameters ranging from 180 nm to 1200 nm ( Fig. 1(a)) are defined by electron-beam lithography, sputtering, and lift-off. 18 We use the conductive tip of an atomic force microscope (AFM) to connect individual top electrodes and perform electric transport measurements under a constant v...

We report deterministic selection of polarization variant in bismuth BiFeO3 nanoislands via a two-step scanning probe microscopy procedure. The polarization orientation in a nanoisland is toggled to the desired variant, after a reset operation, by scanning a conductive atomic force probe in contact over the surface while a bias is applied. The final polarization variant is

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Conducting atomic force microscopy images of bulk semiconducting BaTiO3 surfaces show clear stripe domain contrast. High local conductance correlates with strong out-of-plane polarization (mapped independently using piezoresponse force microscopy), and current-voltage characteristics are consistent with dipole-induced alterations in Schottky barriers at the metallic tip-ferroelectric interface. Indeed, analyzing current-voltage data in terms of established Schottky barrier models allows relative variations in the surface polarization, and hence the local domain structure, to be determined. Fitting also reveals the signature of surface-related depolarizing fields concentrated near domain walls. Domain information obtained from mapping local conductance appears to be more surface-sensitive than that from piezoresponse force microscopy. In the right materials systems, local current mapping could therefore represent a useful complementary technique for evaluating polarization and local electric fields with nanoscale resolutio