We fabricated Pr 3+ -activated glasses having a composition of 10SrO-5Al 2 O 3 -85TeO 2 (PSAT) for potential use as radiation detectors, and their photoluminescence (PL) and X-ray-induced scintillation properties were then characterized. The PSAT glasses showed several emission peaks in their PL spectra owing to the 4f-4f transitions of Pr 3+ . Furthermore, they exhibited typical PL decay times (0.09-0.86 ms), where the decay originated from the 4f-4f transitions of Pr 3+ . In the scintillation spectra of the PSAT glasses, three peaks at approximately 480, 618, and 636 nm were observed. The scintillation decay times were 0.747-0.840 ms, corresponding to the 4f-4f transitions of Pr 3+ . Furthermore, the PSAT glasses showed afterglow levels of 352-521 ppm, and the lowest afterglow level (352 ppm) was comparable to that of Tl-activated CsI single crystal.
We investigated photoluminescence (PL) and scintillation properties of Dy-doped tellurite glasses [80TeO 2 5Al 2 O 3 (15 ¹ x)BaOxDy 2 O 3 (x = 0.10.5)]. The Dy-doped tellurite glasses were prepared by the conventional melt-quenching method. In PL, all the Dy-doped tellurite glasses showed sharp emission peaks at approximately 575, 660 and 755 nm originated from the 4f4f transition of Dy 3+. The 0.5 and 1.0 % Dy-doped tellurite glasses exhibited high PL intensities under 450 nm excitation light. In scintillation, the Dy-doped tellurite glasses showed emissions peaking at approximately 485, 585 and 665 nm due to the 4f4f transitions of Dy 3+ , and the 1.0 % Dydoped tellurite glass exhibited the highest scintillation intensity. Furthermore, the PL and scintillation decay time constants of the Dy-doped tellurite glasses were about 12.6367 and 30.2248¯s, respectively. Theses decay time constants were typical values for the 4f4f transition of Dy 3+. In addition, the Dy-doped tellurite glasses showed moderate afterglow levels of about 289751 ppm, and the afterglow level of the 1.0 % Dy-doped tellurite glass (289 ppm) was almost comparable to that of a commonly used inorganic scintillator Tl-doped CsI.
Photoluminescence and scintillation characteristics of Nd3+-doped TeO2 glasses [(15–x)BaO–5Al2O3–80TeO2–xNd2O3 (x = 0.1–1.0)] were evaluated. The Nd3+-doped TeO2 glasses exhibited sharp emission peaks originating from the 4f–4f transition of Nd3+ in photoluminescence. The 0.1% Nd3+-doped TeO2 glass showed the highest quantum yield (about 33%). In addition, 0.1%–1.0% Nd3+-doped TeO2 glasses showed photoluminescence decay time constants in the time range of 128–194 μs originating from the 4F3/2 → 4I9/2 transition of Nd3+. In scintillation, the 0.1%–1.0% Nd3+-doped TeO2 glasses exhibited sharp scintillation peaks at around 905, 1060, and 1335 nm ascribed to the 4f–4f transitions of Nd3+. The 0.5% and 1.0% Nd3+-doped TeO2 glasses exhibited high intensities. The decay times of the Nd3+-doped TeO2 glasses under X-ray were in the time range of 123–174 μs. Moreover, the Nd3+-doped TeO2 glasses exhibited afterglow levels of about 618–829 ppm.
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