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Silica is a very interesting system that has been thoroughly studied in the last decades. One of the most outstanding characteristics of silica suspensions is their stability in solutions at high salt concentrations. In addition to that, measurements of direct-interaction forces between silica surfaces, obtained by different authors by means of surface force apparatus or atomic force microscope (AFM), reveal the existence of a strong repulsive interaction at short distances (below 2 nm) that decays exponentially. These results cannot be explained in terms of the classical Derjaguin, Landau, Verwey, and Overbeek (DLVO) theory, which only considers two types of forces: the electrical double-layer repulsion and the London-van der Waals attraction. Although there is a controversy about the origin of the short-range repulsive force, the existence of a structured layer of water molecules at the silica surface is the most accepted explanation for it. The overlap of structured water layers of different surfaces leads to repulsive forces, which are known as hydration forces. This assumption is based on the very hydrophilic nature of silica. Different theories have been developed in order to reproduce the exponentially decaying behavior (as a function of the separation distance) of the hydration forces. Different mechanisms for the formation of the structured water layer around the silica surfaces are considered by each theory. By the aid of an AFM and the colloid probe technique, the interaction forces between silica surfaces have been measured directly at different pH values and salt concentrations. The results confirm the presence of the short-range repulsion at any experimental condition (even at high salt concentration). A comparison between the experimental data and theoretical fits obtained from different theories has been performed in order to elucidate the nature of this non-DLVO repulsive force.

Republication or reproduction of this report or its storage and/or dissemination by electronic means is permitted without the need for formal IUPAC permission on condition that an acknowledgmentAbstract: The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection of the spring, which is monitored optically. Usually, a feedback loop is employed, which holds the spring deflection constant, and the corresponding movement of the piezoelectric positioner thus generates the image. From this it can be seen that the scanning AFM has all the attributes necessary for the determination of surface and adhesion forces; a sensitive spring to determine the force, a piezoelectric crystal to alter the separation of the tip and surface, which if sufficiently well-calibrated also allows the relative separation of the tip and surface to be calculated. One can routinely quantify both the net surface force (and its separation dependence) as the probe approaches the sample, and any adhesion (pulloff) force on retraction. Interactions in relevant or practical systems may be studied, and, in such cases, a distinct advantage of the AFM technique is that a particle of interest can be attached to the end of the cantilever and the interaction with a sample of choice can be studied, a method often referred to as colloid probe microscopy. The AFM, or, more correctly, the scanning probe microscope, can thus be used to measure surface and frictional forces, the two foci of this article. There have been a wealth of force and friction measurements performed between an AFM tip and a surface, and many of the calibration and analysis issues are identical to those necessary for colloid probe work. We emphasize that this article confines itself primarily to elements of colloid probe measurement using the AFM.

Friction force measurements have been conducted with a colloid probe on mica and silica (both hydrophilic and hydrophobized) after long (24 h) exposure to high-humidity air. Adhesion and friction measurements have also been performed on cellulose substrates. The long exposure to high humidity led to a large hysteresis between loading and unloading in the friction measurements with separation occurring at large negative applied loads. The large hysteresis in the friction-load relationship is attributed to a contact area hysteresis of the capillary condensate which built up during loading and did not evaporate during the unloading regime. The magnitude of the friction force varied dramatically between substrates and was lowest on the mica substrate and highest on the hydrophilic silica substrate, with the hydrophobized silica and cellulose being intermediate. The adhesion due to capillary forces on cellulose was small compared to that on the other substrates, due to the greater roughness of these surfaces.