Improvements of the internal quantum efficiency by reduction of the threading dislocation density and of the light extraction by using UV transparent p-type cladding and contact layers, UV reflecting ohmic contact, and chip encapsulation with optimized shape and refractive index allowed us to obtain the external quantum efficiency of 10.4% at 20 mA CW current with the output power up to 9.3 mW at 278 nm for AlGaN-based deep-ultraviolet light-emitting diodes grown on sapphire substrates.
InAs self-organized quantum dots inserted in InGaAs quantum well have been grown on GaAs substrates by molecular beam epitaxy. The lateral size of the InAs islands has been found to be approximately 1.5 times larger as compared to the InAs/GaAs case, whereas the island heights and surface densities were close in both cases. The quantum dot emission wavelength can be controllably changed from 1.1 to 1.3 μm by varying the composition of the InGaAs quantum well matrix. Photoluminescence at 1.33 μm from vertical optical microcavities containing the InAs/InGaAs quantum dot array was demonstrated.
We present the analysis of the external quantum efficiency in AlGaN deep ultraviolet (DUV) light-emitting diodes (LEDs) on sapphire substrates and discuss factors affecting the output power of DUV LEDs. Performance of the LED is related to optimization of the device structure design and improvements of the epitaxial material quality.
We report on 245–247 nm AlGaN-based deep ultraviolet (DUV) light-emitting diodes with continuous wave output power up to 2 mW. DUV diodes with peak emission wavelength of 245 and 247 nm exhibit turn-on voltage less than 10 V. At room temperature and cw operation the maximum external quantum efficiency was close to 0.18%, which is the highest value published to date for devices with peak emission wavelength shorter than 250 nm. A large external efficiency droop observed at current densities above 100 A/cm2 is attributed to self-heating, carrier spillover from the QWs into the barrier layers or the p-type cladding layer, and/or Auger recombination. A semiempirical equation was proposed to describe the efficiency droop in DUV diodes at a high current injection.
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