Phase-slip lines can be viewed as dynamically created Josephson junctions in a homogeneous superconducting film. In contrast to phase-slip centers, phase-slip lines occur in wide superconducting strips, where the order parameter may vary in two dimensions. We investigated phase-slip lines in two different materials using several methods. We observed Shapiro steps under microwave radiation, which shows that the frequency of the order parameter oscillation is equal to Josephson frequency. A periodic oscillation of a critical current versus the applied magnetic field was found in strips with a hole in the middle. The latter effect provides a clear evidence of macroscopic quantum interference across a phase-slip line. We have used low temperature scanning laser microscopy to visualize the phase-slip lines and to distinguish them from possible local inhomogeneities in the films.

The work describes the capabilities of Laser Scanning Microscopy (LSM) as a spatiallyresolved method of testing high-T c materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.

We fabricated and characterised nanowire superconducting single-photon detectors (SSPDs) made of 4 nm thick amorphous Mo x Si 1−x films. At 1.7 K the best devices exhibit a detection efficiency up to 18% at 1.2 µm wavelength of unpolarised light, a characteristic response time of about 6 ns and timing jitter of 120 ps. The detection efficiency was studied in wavelength range from 650 nm to 2500 nm. At wavelengths below 1200 nm these detectors reach their maximum detection efficiency limited by photon absorption in the thin MoSi film.