2006
DOI: 10.1063/1.2215376
|View full text |Cite
|
Sign up to set email alerts
|

Laser scanning microscopy of HTS films and devices (Review Article)

Abstract: The work describes the capabilities of Laser Scanning Microscopy (LSM) as a spatiallyresolved method of testing high-T c materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven b… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

2
68
1

Year Published

2010
2010
2024
2024

Publication Types

Select...
6
1
1

Relationship

3
5

Authors

Journals

citations
Cited by 62 publications
(71 citation statements)
references
References 61 publications
2
68
1
Order By: Relevance
“…Details of the RF and laser excitations of the spirals have been previously published [29,[31][32][33]. The spiral develops a photoresponse due to pair-breaking and localized heating, producing a change in its resonant frequency and quality factor [37,38]. The laser intensity is modulated at 100 kHz, and the changes in RF transmission at a fixed frequency are phase sensitively detected, resulting in a photoresponse (PR) signal consisting of both a magnitude and phase.…”
mentioning
confidence: 99%
“…Details of the RF and laser excitations of the spirals have been previously published [29,[31][32][33]. The spiral develops a photoresponse due to pair-breaking and localized heating, producing a change in its resonant frequency and quality factor [37,38]. The laser intensity is modulated at 100 kHz, and the changes in RF transmission at a fixed frequency are phase sensitively detected, resulting in a photoresponse (PR) signal consisting of both a magnitude and phase.…”
mentioning
confidence: 99%
“…Our measurements indicate that the device performance is limited by reflections between the superconducting parts on the chip and the normal conducting microwave connectors. This conclusion is based on our data obtained by low temperature laser scanning microscopy (LTLSM) 14,15 . Our experiments indicate that our hybrid ring couplers are highly suitable for integration into superconducting circuit QED experiments 16 , ultimately allowing for studies of propagating quantum microwaves [11][12][13] and applications in quantum information processing.…”
mentioning
confidence: 75%
“…To explore these artifacts, we visualize the effects of reflections by measuring the response of a hybrid ring on a silicon substrate to local heating by a focused laser beam. This method is known as low temperature laser scanning microscopy 14 . In these experiments, a focused laser beam is scanned across the chip surface and the change in the transmission parameter S 42 is recorded as function of the beam position.…”
mentioning
confidence: 99%
“…The values of d T and τ at 4.2 K in thin film HTS studied with LTLSM range between 1-10 μm and 0.1-10 μs. 25 The spatial resolution can be estimated as 6 …”
Section: Discussionmentioning
confidence: 99%
“…Low temperature laser scanning microscopy (LTLSM) is a well-known technique to characterize loss mechanisms in high-temperature superconductors (HTS). 6 The origins of the technique go back to electron-beam heating 7 and visualization of low-frequency transport processes and vortex motion in superconductors. 8 Later the method was adapted to laser heating and measurement of high frequency transport processes.…”
Section: Introductionmentioning
confidence: 99%