It is shown by IR spectroscopy that the thermal oxidation of (NiO + PbO)/InP structures leads to the formation of nickel and lead polyphosphates and indium ortho-and metaphosphates. The nickel phosphates may then gradually transform into diphosphates, depending on the oxidation temperature, whereas the lead phosphates undergo no changes.
The kinetic parameters and the limiting stage of the defining process were established by studying the thermal oxidation of SnO 2 /InP heterostructures (thickness of SnO 2 layer ∼ 50 nm). It was established that SnO 2 does not have a chemical stimulating effect on the film growth rate; however, it is effective as a modifier of their structure and properties. SnO 2 provides the formation of nanoscale films with semiconductor properties.
The thickness and optical constants of films grown through the thermal oxidation of V 2 O 5 /InP, (NiO + PbO)/InP, and (V 2 O 5 + PbO)/InP structures produced by magnetron sputtering have been deter mined by spectral ellipsometry. The results demonstrate that the structures have sharp interfaces and their optical constants in the long wavelength part of the spectrum are well described by the Cauchy model with a normal dispersion law, which allows one to determine the thickness of such nanofilms with high accuracy using high speed ellipsometric characterization with a single wavelength laser ellipsometer.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.