Resistive random access memory (RRAM) utilizes the resistive switching behavior to store information. Compared to charge-based memory devices, the merits of RRAM devices include multi-bit capability, smaller cell size, and energy per bit (~fJ/bit). In this chapter, we review different perovskite material-based resistive random access memories (RRAMs). We first introduce the history of RRAM development and operational mechanism of conduction, followed by a review of two types of materials with perovskite crystal structure. One is conventional perovskite oxides (PCMO, a-LCMO, etc.), and the other is perovskite halides (organic-inorganic hybrid perovskites and inorganic perovskites) that have recently emerged as novel materials in optoelectronic fields. Our goal is to give a comprehensive review of perovskite-based RRAM materials that can be used for neuromorphic computing and to help further ongoing development in the field.As aforementioned, a basic RRAM device usually consists of two electrodes and an active layer. The top and bottom electrodes can use various materials, including elementary substantial metals (Ag, Cu, Al, Au, Pt, W, etc.) [5], metallic alloys (Pt-Al, Cu-Ti, etc.) [6], and oxides (ITO, SrRuO 3 , Nb:SrTiO 3 , etc.) [7][8][9]. Based on the functions in RS conversion, the electrode materials can be divided into two types. One is active electrodes (Cu, Ag, etc.), which contribute to the RS conversion by the migration and/or redox reaction of the electrode ions around the electrode/active layer junction. The other is inert electrodes (Pt, Au, etc.), which do not directly participate in the RS conversion.As for the active layer, various materials have been utilized in memory devices, such as amorphous metal oxides, polymers, hybrid composites, perovskite oxides, and perovskite halides [10,11]. The material choice of RRAM active layer has significant influence on the device performance. In this chapter, we will mainly introduce oxides and halides with perovskite structures. Perovskite oxides are a conventional active material family for memories. In addition to high-endurance, chemically stable, and high-speed operation, the strong electron correlation induces many unique properties for perovskite oxides, which makes it remain as one of the most promising materials for RRAM yet. Compared with conventional RRAMs, perovskite halides can make flexible devices with low-cost fabrication, compositional flexibility, and excellent optoelectronic properties, enabling the perovskite halides as a promising next-generation memory material family. Next, we will introduce the memory devices with perovskite oxides and halides separately.