Yoke flux reversal time in thin-film write heads

Klaassen, K.B.; Peppen, J.C.L. van

doi:10.1109/20.490083

Cited by 14 publications

(4 citation statements)

References 2 publications

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“…1. Other calculations [2,3] and experimental work [4,5] also support the simple model by Wood and Williams [I]. In order to observe t h~s phenomenon experimentally, average dynamic magnetization reversals in response to the high frequency and high amplitude sinusoidal current were observed at the air-bearing surfaces (ABS) of thin film inductive and magnetoresistive (MR) write heads by using a Scanning Kerr Effect Microscope (SKEM).…”

Section: Introductionmentioning

confidence: 69%

High frequency magnetization response observed at the air-bearing surfaces of thin film heads

1996

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Magnetization response during high frequency and high amplitude write current excitations at the air-bearing surfaces (ABS) of thin film inductive and MR write heads were observed by using a Scanning Kerr Effect Microscope. Under certain excitation conditions, bubble-like dynamic domain walls that separate the regions of 180' out-of-phase magnetization reversals were observed predominately at the ABS of trailing poles (3'2). This magnetization reversal mechanism is believed to be introduced by the combined effects of eddy current damping and local magnetization saturation, and is consistent with the model proposed by Wood and Williams.

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Section: Introductionmentioning

confidence: 69%

High frequency magnetization response observed at the air-bearing surfaces of thin film heads

1996

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“…Further improvement of write head design, process and material, in combination with write driver/interconnect optimization [18]- [20], should lead to much higher recording data rate. Although significant progress toward high data rate writing is achieved in this work, there is room for much further improvement toward the physical limit of switching speed [21].…”

Section: Discussionmentioning

confidence: 99%

Advanced write heads for high density and high data rate recording

et al. 2002

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Advanced write head designs improve write efficiency, by reducing yoke length to less than 15 m, adapting a sunken coil/P1 pedestal structure with stitched pole, and utilizing high moment poles with greater than 2 Tesla moment. Sufficient bit-error rate was achieved up to 680 kBPI, using heads with 50-60 GB/in 2 dimensions. For wider track width heads, spin-stand testing showed good writing parametrics and soft error rate up to 1.0-1.1 Gb/s channel data rate, with product electronics and channels. Feasibility of high-speed recording up to 1.5 Gb/s is demonstrated using experimental write drivers.Index Terms-High data rate, high moment, write head.

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“…An infinite track width, perfectly centered, shielded GMR sensor is used to computer the readback voltage. The potential at the surface of the GMR, , is approximated by [12], [13] if if if (4) where is the GMR shield to shield spacing, and is the GMR free layer thickness. The readback voltage is then given by (5) where is a constant, is the media magnetization obtained from the media micromagnetic simulation, and is the GMR reciprocity function corresponding to the ABS potential (4) [13].…”

Section: Reader Modelmentioning

confidence: 99%

“…Without proper impedance matching, voltage signals launched along a flex trace will reflect back to the source and interfere with signals that occurred after the initial launch. In addition, there are limitations that are fundamental to the recording head and to the read/write process [3], [4]. In order for recorded data to remain stable (thermally and high SNR) at such high densities, the media coercivity needs to be high and the remanent magnetization low.…”

Section: Introductionmentioning

confidence: 99%

Front-End Write Process Model for High Data Rate Longitudinal Magnetic Recording

Wolfson¹,

Torabi²,

Benakli³

et al. 2004

IEEE Trans. Magn.

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In drive designs with write data rates 1 Gb/s, transitions sent to the write head collide at 1T with reflections from earlier transitions. This increases the need for write-driver voltage headroom, efficient interconnects, and efficient magnetic materials. Design alternative studies in this regime require detailed models of all components in the write process. We modeled nonlinear bit transition shift (NLTS) and spectral signal-to-noise ratio (SNR) measurements using our preamp/interconnect/writer/media model and compared it to measurements of the actual devices that were modeled. We describe methods for reconciling write driver models with varying head and interconnect impedance, verification performed with scanning Kerr effect microscopy (SKEM), and magnetic models with instantaneous nonlinear effects included.Index Terms-Circuit modeling, finite-element methods, magnetic disk recording, micromagnetic modeling.

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Yoke flux reversal time in thin-film write heads

Cited by 14 publications

References 2 publications

High frequency magnetization response observed at the air-bearing surfaces of thin film heads

High frequency magnetization response observed at the air-bearing surfaces of thin film heads

Advanced write heads for high density and high data rate recording

Front-End Write Process Model for High Data Rate Longitudinal Magnetic Recording

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