Magnetization response during high frequency and high amplitude write current excitations at the air-bearing surfaces (ABS) of thin film inductive and MR write heads were observed by using a Scanning Kerr Effect Microscope. Under certain excitation conditions, bubble-like dynamic domain walls that separate the regions of 180' out-of-phase magnetization reversals were observed predominately at the ABS of trailing poles (3'2). This magnetization reversal mechanism is believed to be introduced by the combined effects of eddy current damping and local magnetization saturation, and is consistent with the model proposed by Wood and Williams.
Using a scanning Kerr effect microscope with external ac-tickle field excitation, zigzagged and slanted intersections of domain walls were observed at the symmetry-axis cross sections of thin film inductive heads. These domain walls are believed to be the intersections of edge-closure domain walls, with the magnetization on the two sides of the walls (or lines) oriented in ‘‘head-to-head’’ or ‘‘tail-to-tail’’ configurations. They are thus slanted or zigzagged in order to spread the charges along the walls over a larger region, thereby reducing magnetostatic energy. This interpretation is further evident by the observation that upon applying a small dc bias field in the symmetry-axis direction, the slanted or zigzagged intersections of domain walls were observed to displace according to the field direction, and sometimes deformed to different configurations. Upon lapping the heads from their air-bearing surfaces, slanted domain walls at the sloped backgap cross sections were occasionally observed.
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