2007 30th International Spring Seminar on Electronics Technology (ISSE) 2007
DOI: 10.1109/isse.2007.4432851
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XRD, XPS and SEM Characterization of Photoconductive CdS Layers Deposited by Vacuum Thermal Evaporation

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“…The cadmium 3d 5/2 peak had a binding energy of 405.0 eV in the CdZnTe bulk but the peak energy was measured to increase by ∼0.2 eV and also to broaden by ∼0.2 eV (FWHM) between an etch time of ∼2000-15 500 s (see figure 9(b)). The cadmium peak is known to shift to higher binding energies when bound with Cl [20,43]. The ratio of the second cadmium PCA component (Cd PCA2) to chlorine (Cl 2p) was found to be ∼1 : 1 throughout the profile suggesting a phase of CdCl, although CdCl 2 could have formed [33][34][35][36] with the ratio distorted by preferential etching.…”
Section: Xps Depth Profilesmentioning
confidence: 99%
“…The cadmium 3d 5/2 peak had a binding energy of 405.0 eV in the CdZnTe bulk but the peak energy was measured to increase by ∼0.2 eV and also to broaden by ∼0.2 eV (FWHM) between an etch time of ∼2000-15 500 s (see figure 9(b)). The cadmium peak is known to shift to higher binding energies when bound with Cl [20,43]. The ratio of the second cadmium PCA component (Cd PCA2) to chlorine (Cl 2p) was found to be ∼1 : 1 throughout the profile suggesting a phase of CdCl, although CdCl 2 could have formed [33][34][35][36] with the ratio distorted by preferential etching.…”
Section: Xps Depth Profilesmentioning
confidence: 99%