XPS studies of chemically etched surfaces of (La,Sr)(Al,Ta)O3 single crystals

Talik, E.; Kruczek, M.; Sakowska, H.; Szyrski, W.

doi:10.1016/s0925-8388(03)00424-9

Cited by 34 publications

(16 citation statements)

References 16 publications

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“…The small contributions at lower binding energy for all measured lines may be ascribed to defects near the cone part of the crystal. Similar broadening of the lines to lower binding energy was described for NdGaO 3 and (La,Sr)(Al,Ta)O 3 [11,12]. For the NdGaO 3 crystals all lines even for the broken wafers exhibit low binding energy satellites, whose intensities were dependent on the treatment and decreased significantly after annealing of the crystal.…”

Section: Resultssupporting

confidence: 69%

X‐ray photoelectron spectroscopy investigations of Y₃Al₅O₁₂:Yb single crystal

Kruczek

Talik

Sakowska

et al. 2005

Cryst. Res. Technol.

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X-ray photoelectron spectroscopy was used to study the chemical composition and electronic structure of the Y 3 Al 5 O 12 :Yb (YAG:Yb) crystals. The contamination of the crystal with carbon and oxygen in the broken under UHV sample was found. The dopant concentration of Yb, in the mixed valence state, was determined as 12 %. The aluminium concentration is lower than a nominal value. The chemical shift analysis shows more ionic bond of Y-O than Al-O.

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Section: Resultssupporting

confidence: 69%

X‐ray photoelectron spectroscopy investigations of Y₃Al₅O₁₂:Yb single crystal

Kruczek

Talik

Sakowska

et al. 2005

Cryst. Res. Technol.

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“…It indicated that this line was connected with some defects existing in the crystal. Similar behavior of the O 1s line was found for (LaSr)(AlTa)O 3 [4]. The Ga 2p lines exhibited, besides the main line, an additional satellite line at lower binding energy (Fig.…”

Section: Resultssupporting

confidence: 78%

Characterization of NdGaO3 grown along [110] direction by the XPS method

Talik

Kruczek

Sakowska

et al. 2005

Journal of Crystal Growth

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“…The spectra of the next parts are narrower but exhibit also additional lines at lower binding energy (the lowest for the end). These extra lines have much lower intensity and may be ascribed to some defects present in these fragments as was observed for the (La, Sr)(Al, Ta)O 3 crystals (Tables 2 and 3) [12].…”

Section: Electronic Structure Of a Ndgao 3 Crystal Grown Along The [0mentioning

confidence: 60%