XPS and QCM Studies of Hydrocarbon and Fluorocarbon Polymer Films Bombarded by 1−20 keV C<sub>60</sub> Ions

Bolotin, Igor L.; Tetzler, Stephanie H.; Hanley, Luke

doi:10.1021/jp0718000

Cited by 11 publications

(15 citation statements)

References 55 publications

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“…20–24 It is shown here that ultrashort pulse laser ablation should be feasible for depth profiling of tissue with a few tens of microns depth resolution when used in combination with an MS analysis method. Furthermore, prior work with ultrashort pulse micromachining indicates a potential for sub-µm depth resolution.…”

Section: Discussionmentioning

confidence: 94%

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Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

et al. 2012

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Experiments were performed to examine the feasibility of MS depth profiling of animal tissue by ~75 fs, 800 nm laser pulses to expose underlying layers of tissue for subsequent MS analysis. Matrix assisted laser desorption ionization mass spectrometry (MALDI-MS) was used to analyze phospholipids and proteins from both intact bovine eye lens tissue and tissue ablated by ultrashort laser pulses. Laser desorption postionization (LDPI-MS) with 10.5 eV single photon ionization was also used to analyze cholesterol and other small molecules in the tissue before and after laser ablation. Scanning electron microscopy was applied to examine the ablation patterns in the tissue and estimate the depth of the ablation craters. Ultrashort pulse laser ablation was found able to remove a layer of several tens of micrometers from the surface of eye lens tissue while leaving the underlying tissue relatively undamaged for subsequent MS analysis. MS analysis of cholesterol, phospholipids, peptides, and various unidentified species did not reveal any chemical damage caused by ultrashort pulse laser ablation for analytes smaller than ~6 kDa. However, a drop in intensity of larger protein ions was detected by MALDI-MS following laser ablation. An additional advantage was that ablated tissue displayed up to an order of magnitude higher signal intensities than intact tissue when subsequently analyzed by MS. These results support the use of ultrashort pulse laser ablation in combination with MS analysis to permit depth profiling of animal tissue.

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Section: Discussionmentioning

confidence: 94%

“…19 By contrast, the extent of chemical damage during cluster ion depth profiling in secondary ion mass spectrometry has been extensively explored. 20–24 …”

Section: Introductionmentioning

confidence: 99%

Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

et al. 2012

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“…The impact of water cluster ions following-up enhances the ejection of methacrylic acid molecule at the monomer state from the surface. Thus, the high rate sputtering of PMMA surfaces is achieved by both the chemical erosion of the surface and the momentum transfer of the incident energy, which is different from the sputtering of PMMA surfaces reported elsewhere [15][16][17]. Figure 3 shows the dependence of sputtered depth for Si(100) and SiO 2 surfaces on the ion dose.…”

Section: Resultsmentioning

confidence: 84%

“…Figure 2 shows the dependence of sputtered depth for Si(100), SiO 2 and PMMA surfaces on acceleration voltage for water cluster ions. The ion dose was 1.0×10 16 ions/cm 2 , and the cluster size used was larger than 300 molecules per cluster. As shown in the figure, the sput- tered depth increases with increase of the acceleration voltage, and it is 37 nm for Si, 49 nm for SiO 2 , and 2.9 µm for PMMA substrates, respectively at an acceleration voltage of 9 kV.…”

Section: Resultsmentioning

confidence: 99%

Chemical Modification of Solid Surfaces at Nano-level by Water Cluster Ion Irradiation

Takaoka

Ichihashi

Ryuto

et al. 2011

e-J. Surf. Sci. Nanotechnol.

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We have investigated impact-process of water cluster ions on solid surfaces. Various kinds of substrates such as Si(100), SiO2 and PMMA substrates were irradiated by adjusting the acceleration voltage and the ion dose. The sputtered depth of these substrates increased with increase of the acceleration voltage, and it was 37 nm for Si, 49 nm for SiO2, and 2.9 µm for PMMA substrates, respectively at an acceleration voltage of 9 kV and an ion dose of 1.0×1016 ions/cm 2 . The sputtering yield calculated was 19 atoms per ion for Si and 13 molecules per ion for SiO2, which was approximately ten times larger than that for Ar monomer ion irradiation. The XPS measurement showed that the Si substrate surfaces sputtered at an ion dose of 1.0×1016 ions/cm 2 had an oxide layer such as SiOx. The oxide layer thickness increased with increase of the acceleration voltage, and it was approximately 10 nm at an acceleration voltage of 6 kV. On the other hand, at lower ion doses such as 1.0×1014 ions/cm 2 , the ratio of the sputtered depth of Si surface to SiO2 surface became approximately 10. This indicated that the chemical erosion such as silicon hydride occurred, resulting in enhancement of chemical sputtering of Si substrates. Furthermore, for the case of PMMA substrates, the chemical erosion of the substrate surfaces occurred probably through the exchange between CH3 and H radicals, and the chemical sputtering by the ejection of methacrylic acid molecule was enhanced. The surface roughness of PMMA substrates irradiated was less than 2 nm, and the smooth surface at the nano-level was obtained. In addition, micro-patterning was demonstrated with the water cluster ion beams on the PMMA substrates.

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“…The instrumentation used in this work for ion bombardment and X-ray photoelectron analysis has been previously described [58][59][60]. The ion irradiation layout can be seen in Figure 1.…”

Section: Methodsmentioning

confidence: 99%

Metal impurity-assisted formation of nanocone arrays on Si by low energy ion-beam irradiation

et al. 2016

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Fabrication of nanocone arrays on Si surfaces was demonstrated using grazing incidence irradiation with 1 keV Ar + ions concurrently sputtering the surface and depositing metal impurity atoms on it. Among three materials compared as co-sputtering targets Si, Cu and stainless steel, only the steel was found to assist the growth of dense arrays of nanocones at ion fluences between 10 18 and 10 19 ions/cm 2. The structural characterization of samples irradiated with these ion fluences using Scanning Electron Microscopy and Atomic Force Microscopy revealed that regions far away from co-sputtering targets are covered with nanoripples, and that nanocones popped-up out of the rippled surfaces when moving closer to co-sputtering targets, with their density gradually increasing and reaching saturation in the regions close to these targets. The characterization of the samples' chemical composition with Total Reflection X-ray Fluorescence Spectrometry and X-ray Photoelectron Spectroscopy revealed that the concentration of metal impurities originating from stainless steel (Fe, Cr and Ni) was relatively high in the regions with high density of nanocones (Fe reaching a few atomic percent) and much lower (factor of 10 or so) in the region of nanoripples. Total Reflection X-ray Fluorescence Spectrometry measurements showed that higher concentrations of these impurities are accumulated under the surface in both regions. X-ray Photoelectron Spectroscopy experiments showed no direct evidence of metal silicide formation occurring on one region only (nanocones or nanoripples) and thus showed that this process could not be the driver of nanocone array formation. Also, these measurements indicated enhancement in oxide formation on regions covered by nanocones. Overall, the results of this study suggest that the difference in concentration of metal impurities in the thin near-surface layer forming under ion irradiation might be responsible for the differences in surface structures.

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XPS and QCM Studies of Hydrocarbon and Fluorocarbon Polymer Films Bombarded by 1−20 keV C₆₀ Ions

Cited by 11 publications

References 55 publications

Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

Chemical Modification of Solid Surfaces at Nano-level by Water Cluster Ion Irradiation

Metal impurity-assisted formation of nanocone arrays on Si by low energy ion-beam irradiation

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XPS and QCM Studies of Hydrocarbon and Fluorocarbon Polymer Films Bombarded by 1−20 keV C60 Ions

Cited by 11 publications

References 55 publications

Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

Feasibility of Depth Profiling of Animal Tissue by Ultrashort Pulse Laser Ablation

Chemical Modification of Solid Surfaces at Nano-level by Water Cluster Ion Irradiation

Metal impurity-assisted formation of nanocone arrays on Si by low energy ion-beam irradiation

Contact Info

Product

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XPS and QCM Studies of Hydrocarbon and Fluorocarbon Polymer Films Bombarded by 1−20 keV C₆₀ Ions