2015
DOI: 10.1016/j.mssp.2015.05.064
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XPS analysis and characterization of thin films Cu2ZnSnS4 grown using a novel solution based route

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Cited by 40 publications
(19 citation statements)
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“…The average binding energy (BE) values with uncertainties estimated at ~ ±0.01 eV are listed in Table S2, in which the BE values of Cu2p are ~932.30 eV and 952.22 eV, with a peak separation of ~19.90 eV, indicating the presence of Cu + . [27][28][29] The two peaks of the S2p XPS spectra in CTS or base material are ~161.55 eV and ~162.75 eV, with a peak separation of 1.20 eV, which are consistent with the expected values (160−164 eV) of S in sulfide phases. Hence, S 2can be identified.…”
Section: Xpssupporting
confidence: 78%
“…The average binding energy (BE) values with uncertainties estimated at ~ ±0.01 eV are listed in Table S2, in which the BE values of Cu2p are ~932.30 eV and 952.22 eV, with a peak separation of ~19.90 eV, indicating the presence of Cu + . [27][28][29] The two peaks of the S2p XPS spectra in CTS or base material are ~161.55 eV and ~162.75 eV, with a peak separation of 1.20 eV, which are consistent with the expected values (160−164 eV) of S in sulfide phases. Hence, S 2can be identified.…”
Section: Xpssupporting
confidence: 78%
“…The donor density can be estimated from the slope. The obtained values of the charge carrier concentration for 67% duty cycle, 50% duty cycle, and 33% duty cycle correspondingly are 2.56x10 16 , 2.55x10 16 , and 2.55x10 16 cm -3 which closely reflect reported values in other studies [8,34,[39][40][41][42][43][44][45][46][47][48]. In addition, by the extrapolation of 1/ 2 sc C = 0, the flat band potential values of the films deposited at different duty cycles can be determined.…”
Section: Accepted Manuscriptsupporting
confidence: 86%
“…In an article published previously [13] there were reported results of a study performed using XRD, Raman spectroscopy and XPS (X-ray photoelectron spectroscopy) to thin films of CTS and CZTS deposited by both membrane assisted CBD and sequential evaporation of precursors. The XRD and Raman study revealed that with both methods can be grown samples of CTS containing just the Cu 2 SnS 3 phase and samples of CZTS containing only the Cu 2 ZnSnS 4 phase; it was also reported that the CBD deposited CTS and CZTS films present similar structural properties than those of the sequentially evaporated CTS and CZTS films.…”
Section: Experimental Verification Of the Formation Of The Cu 2 Sns 3mentioning
confidence: 99%
“…XPS depth profile analysis performed to Cu 2 ZnSnS 4 and Cu 2 SnS 3 films (see Ref. [13]) do not revealed the presence of oxygen; nevertheless peaks associated to C1s were also identified.…”
Section: Experimental Verification Of the Formation Of The Cu 2 Sns 3mentioning
confidence: 99%
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