XAFS for Characterization of Nanomaterials

Katsikini, M.; Paloura, E. C.

doi:10.1007/978-3-662-48606-1_4

Cited by 1 publication

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“…5 The impact of the nanogranularity of the polycrystalline films on the EXAFS data is therefore expected to be limited, as grain size effects are generally important only for more distant shells than the first and the second ones and for cluster sizes smaller than 10 -15 nm. 8 More details on the morphological characterization of the samples studied here can be found elsewhere. 5 Five samples were prepared with oxygen content limited to 5 -8 at.% with a variable average content of Er ranging from 0.5 to 3.6 at.%.…”

Section: Growth Conditions and Experimental Detailsmentioning

confidence: 99%

Extended X-ray absorption fine structure study of the Er bonding in AlNO:Erx films with x ≤ 3.6%

Katsikini

Katchkanov

Boulet

et al. 2018

Journal of Applied Physics

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Section: Growth Conditions and Experimental Detailsmentioning

confidence: 99%