X‐Ray Topographic Investigation of Dendritic Silicon Crystals

Abstract

Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have becn investigated. I t is shown that t,he surface layers of these crystals have a more perfect structure than their bulk volume. The t w i n lamella is a dislocation-frec formation and there are dislocation-frec zones -1,5 mm in width in the volume of crystals.