X-Ray Study on Deformation and Fracture of Solid. X-Ray Stress Measurement for &lt;110&gt; Oriented TiC Films.

Ejiri, Shouichi; Zheng, Lin; Sasaki, Toshihiko; Hirose, Yukio

doi:10.2472/jsms.46.750

Cited by 9 publications

(3 citation statements)

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“…Hanabusa (1999) applied their analytical formulae to cubic systems with h111i and h110i texture. Ejiri et al (1997) discussed a technique for evaluating stress in cubic systems with h110i fibre texture in an equibiaxial state. Tanaka et al (1998) proposed a stress analysis method for [001] fibre texture in hexagonal systems in a triaxial state using X-ray strain measurement.…”

Section: Introductionmentioning

confidence: 99%

Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture

Yokoyama

Harada

2009

J Appl Cryst

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[224][225][226][227][228][229][230][231][232][233][234] for X-ray stress analysis for polycrystalline specimens with fibre texture is re-examined. By introducing the symmetry of reciprocal lattices for constituent crystallites, the physical meaning of taking an average of the strains observed by X-ray diffraction and the validity of the approximation used are made clear. By applying the present treatment to a cubic specimen in the m3m point group, hkl Bragg reflections with h 6 ¼ k 6 ¼ l split into doublets owing to the existence of crystallites with two different orientations. The formulae derived for cubic polycrystalline specimens with h111i fibre texture in the biaxial state in the Reuss model are in good agreement with those given previously. This technique is applicable to polycrystalline specimens of any symmetry with fibre texture.

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Section: Introductionmentioning

confidence: 99%

Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture

Yokoyama

Harada

2009

J Appl Cryst

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“…When the TiN thin films has the aggregate structure for the {111} priority distribution for the direction of the normal of the sample side, the sin 2 ψ method to which an isotropic homogeneous material is required is not applicable. In that case, residual stress σ x is calculated by using the diffraction angle θ measured by two different ψ angles of the same diffraction plane as X-ray stress measuring method that considers the fiber aggregate structure [3]. Even if the diffraction angle in the distortionless is an unknown, the residual stress can be requested by Eq.…”

Section: Methodsmentioning

confidence: 99%

Influence of Interfacial Neighborhood on Residual Stress due to Deposition of TiN Thin Films Made by PVD

Suzuki

Gotoh

Sasaki

2005

MSF

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Abstract. In depositing the TiN thin films to the substrate by Physical Vapor Deposition (PVD), it influences the substrate interface. Change of the residual stress and the full-width at half maximum (FWHM) in each process of the TiN deposition of thin film was measured by the X-ray stress measurement. As a result of the X-ray stress measurement, there are no changes in the residual stress and the FWHM. It is thought that there is a difference in the penetration depth to the substrate of X-rays and Ti ion.

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“…SS400 was used as a circuit material. The substrate material was processed to the shape of 12×12×5mm 3 . Afterwards, the TiN thin films is deposited to the surface of the substrate material.…”

Section: Methodsmentioning

confidence: 99%

Influence of Interfacial Neighborhood on Residual Stress due to Deposition of TiN Thin Films Made by PVD

Suzuki¹,

Gotoh²,

Sasaki³

2005

Materials Science Forum

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X-Ray Study on Deformation and Fracture of Solid. X-Ray Stress Measurement for <110> Oriented TiC Films.

Cited by 9 publications

References 0 publications

Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture

Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture

Influence of Interfacial Neighborhood on Residual Stress due to Deposition of TiN Thin Films Made by PVD

Influence of Interfacial Neighborhood on Residual Stress due to Deposition of TiN Thin Films Made by PVD

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