2013
DOI: 10.1103/physrevb.87.235401
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X-ray standing wave induced Compton and elastic scattering from thin periodic multilayer structures

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Cited by 12 publications
(2 citation statements)
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“…The wave modulations are typical for the X-ray waveguide structures that are typically observed for specially designed samples [20,21] as it increases significantly the in-depth sensitivity of the XSW analysis. This effect was used, for example, for the increase of the analysis sensitivity to the density of ultra-thin films [22] structure of magnetic layers [23]. For our samples, the waveguide was formed by the sample as is without any explicit design.…”
Section: Xsw Analysis Resultsmentioning
confidence: 99%
“…The wave modulations are typical for the X-ray waveguide structures that are typically observed for specially designed samples [20,21] as it increases significantly the in-depth sensitivity of the XSW analysis. This effect was used, for example, for the increase of the analysis sensitivity to the density of ultra-thin films [22] structure of magnetic layers [23]. For our samples, the waveguide was formed by the sample as is without any explicit design.…”
Section: Xsw Analysis Resultsmentioning
confidence: 99%
“…Multilayer films prepared by properly selected alternate nanolayers are broadly used as reflective mirrors for several applications. In particular, the Mo/Si multilayers are widely used for nanolithography, soft X-ray/EUV microscopy, and solar astronomy. Microscopic structures of interfaces are critical for obtaining the effective reflection coefficient, which, in the first place, mostly depends on the atomic density contrast and the value of β (thickness ratio of the Mo layer to the multilayer period d , i.e., β = d Mo / d ). Understanding the microscopic details including electronic and quantum mechanical properties of the multilayers is fundamentally important, which will be further useful in future to design high-efficiency mirrors.…”
Section: Introductionmentioning
confidence: 99%