2022
DOI: 10.1016/j.apsusc.2021.151573
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Atomic separation in Co/Cu/Co magnetic structures study by hybrid X-ray reflectivity – X-ray standing wave approach

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Cited by 7 publications
(7 citation statements)
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References 31 publications
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“…The corresponding parameters of concentration are indexed similarly and the interfaces are chosen to be at the top of the corresponding layer. A prominent feature of this sample is that the optical contrast between Co and Cu in the hard X-ray range is very small, so it becomes challenging to distinguish parameters in between layers of these materials (Kondratev et al, 2022). In particular, this is one of the reasons which necessitates the use of elementspecific reconstruction for such a sample.…”
Section: Resultsmentioning
confidence: 99%
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“…The corresponding parameters of concentration are indexed similarly and the interfaces are chosen to be at the top of the corresponding layer. A prominent feature of this sample is that the optical contrast between Co and Cu in the hard X-ray range is very small, so it becomes challenging to distinguish parameters in between layers of these materials (Kondratev et al, 2022). In particular, this is one of the reasons which necessitates the use of elementspecific reconstruction for such a sample.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, we assume that these discrepancies are due to the fixed model of the profiles [see equation ( 8)]. For instance, GIXRF data from the same sample were analysed using the free-form approach, which yielded a better fit to the data (Kondratev et al, 2022). However, in this study, we are focusing on a statistical analysis of the sensitivity of both methods, so we are bound to the model-based structure reconstruction.…”
Section: Resultsmentioning
confidence: 99%
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“…The experimental XRR and XRF data were analyzed using the hybrid free-form approach (Kondratev et al, 2022;Novikova et al, 2023), enabling precise reconstruction of the electron density profile without the need for any prior assumptions about the layered structure. In the classical approach to fitting experimental XRR data, the sample is represented as a planar layered structure, with each layer having parameters such as thickness, optical constant and inter-layer (interface) thickness (Windt, 1998).…”
Section: Sample Characterizationmentioning
confidence: 99%