Abstract:The review shows different treatments and methods for the analysis of the X-ray diffraction patterns from the crystals disordered in one direction; the possibilities, limitations, and applications of each method are discussed. The author also provides the examples of simulation of the diffraction patterns for the crystals, which have the effects on the experimental X-ray patterns related with 1D disordering. Several structural types and different kinds of one-dimensional disorder are considered.
“…Two peaks located in the range between 40 and 60°have lower intensities and overlap each other. Such a pattern is typical of nanocrystalline CdS [25,26].…”
Section: Catalyst Characterizationmentioning
confidence: 98%
“…The XRD reflexes of CdS and TiO 2 were separated and average crystallite sizes were determined with the use of the TOPAS software (Bruker, Germany). The XRD patterns of a disordered CdS structure were simulated with the use of an application-specific software [25]. The samples were studied by high resolution transmission electron microscopy (HRTEM) using a JEM-2010 transmission electron microscope (JEOL, Japan) with an accelerating voltage of 200 kV and a resolution of 0.14 nm.…”
“…Two peaks located in the range between 40 and 60°have lower intensities and overlap each other. Such a pattern is typical of nanocrystalline CdS [25,26].…”
Section: Catalyst Characterizationmentioning
confidence: 98%
“…The XRD reflexes of CdS and TiO 2 were separated and average crystallite sizes were determined with the use of the TOPAS software (Bruker, Germany). The XRD patterns of a disordered CdS structure were simulated with the use of an application-specific software [25]. The samples were studied by high resolution transmission electron microscopy (HRTEM) using a JEM-2010 transmission electron microscope (JEOL, Japan) with an accelerating voltage of 200 kV and a resolution of 0.14 nm.…”
“…9) are believed to be related to twinning. The simulation of diffraction patterns of metallic cobalt [23,24] shows that polysynthetic twinning causes the appearance of broad diffraction peaks at both sides of the (1 1 1) reflection. The presence of planar inter-twin boundaries is confirmed by the characteristic stripes on TEM images (see inset in Fig.…”
“…The first series of the samples was prepared in excess of Na 2 S and corresponded to Cd 1Àx Zn x S solid solutions with x ¼ 0.5, 0.7, 0.8, and 0.9. XRD patterns of these samples (not shown) exhibited three broad peaks that are typical of nanocrystalline CdeZn sulfides with a disordered structure [24]. The average crystallite sizes (ACS) of these samples estimated by the Scherrer equation are represented in Table 1.…”
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