X-ray resonant magnetic scattering at L edges of 3d transition metals in multilayers

Tonnerre, J. M.; Sève, L.; Raoux, D.; Rodmacq, B.; Santis, M. De; Troussel, Philippe; Brot, J.M.; Chakarian, V.; Kao, C.‐C.; Johnson, E.; Chen, C.T.

doi:10.1016/0168-583x(94)00721-7

Cited by 17 publications

(5 citation statements)

References 20 publications

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“…X-ray magnetic circular dichroism ͑XMCD͒ is the most commonly used tool to selectively investigate elementspecific magnetic properties. However, there have also been significant advances in the area of x-ray resonant magnetic scattering ͑XRMS͒ using linearly [23][24][25][26][27][28] or circularly [28][29][30][31][32][33][34][35] polarized light to study 3d magnetic multilayers, thin films, and surfaces.…”

Section: Introductionmentioning

confidence: 99%

Magnetic properties of bctFexMn1−xthin-film alloys investigated by linearly polarized soft-x-ray resonant magnetic

et al. 1999

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The magnetic properties of Fe x Mn 1Ϫx /Ir(001) superlattices ͑SL's͒ have been studied using linearly polarized soft x-ray resonant magnetic reflectivity ͑XRMS͒ at the Fe L 2,3 absorption edges. Previous superconducting quantum interference device magnetometry measurements have shown that the SL's exhibit a ferromagnetic behavior for xϾ0.75 and a nonmagnetic or antiferromagnetic one for xϽ0.75. XRMS measurements were performed on two SL's with compositions on each side of xϭ0.75, as well as on a thin layer of Fe-rich alloy (xϭ0.9). The Fe magnetic moments in these alloys were determined by comparing experimental and calculated energy-dependent asymmetry ratios at different angles in the reflectivity curves. Fe atoms are found in a high-spin ferromagnetic state for xϭ0.9, while they are in a low-spin ferromagnetic state for xϭ0.7. Our results emphasize the role of the tetragonalization parameter c/a on the occurrence of the different magnetic states. Measurements, at the Mn L 2,3 edges in a bct Fe 0.9 Mn 0.1 ultrathin layer reveal a net magnetic moment per Mn atom of about 1.7 B coupled antiparallel to the Fe one. ͓S0163-1829͑99͒03933-8͔

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Section: Introductionmentioning

confidence: 99%

Magnetic properties of bctFexMn1−xthin-film alloys investigated by linearly polarized soft-x-ray resonant magnetic

et al. 1999

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“…The expression of R depends on the scattering geometry and on the polarisation state of the beam. In the longitudinal mode using circular polarisation, it is proportional to CrMr -Ci Mi [5], where Mr (Cr) and Mi (Ci) are the real and imaginary parts of M (C), while it is proportional to Cr Mi -CiMr in the transverse mode [9]. Its energy dependence thus may look like the real or the imaginary parts of the MSF, or like any mixture of them.…”

Section: Magnetic Structure Of Multilayers: Diffraction At Low K Valuesmentioning

confidence: 99%

X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

et al. 2000

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This paper reports on the use of a new technique to investigate the magnetic properties of thin films, multilayers and artificial structures, the X-ray resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffraction mode. In comparison with magneto-optical Kerr effect or neutron scattering, it offers an atomic selectivity due to the resonant excitation of a core electron, and even an electronic shell one. Examples are presented mainly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the magnetic moments carried by each of the atomic components in complex systems, as well as their distribution through thin layers, with an atomic resolution.

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“…Compared to the well established neutron diffraction, x-ray magnetic diffraction has several advantages such as the higher resolution and surface sensitivity. Thin magnetic films and multilayers show interesting phenomena such as interlayer exchange coupling ͑IEC͒ across nonmagnetic spacer, 3,5,6 and surface magnetization effects. 7 In this work, we use resonant x-ray diffraction to study the magnetic order in EuTe/ PbTe multilayer structures, demonstrating the capability of the technique to detect IEC and near surface magnetization profiles.…”

Section: Magnetic Ordering Of Eute/ Pbte Multilayers Determined By X-mentioning

confidence: 99%

“…1 In resonant diffraction, the natural weakness of the magnetic diffraction is partially overcome by the intensity enhancement of several orders common at L and M absorption edges of rare earths and transition metals. [2][3][4] Availability of synchrotron sources with bright, white, polarized, and collimated beams has been fundamental for the increasing applications of x-ray magnetic resonant diffraction. Compared to the well established neutron diffraction, x-ray magnetic diffraction has several advantages such as the higher resolution and surface sensitivity.…”

Section: Magnetic Ordering Of Eute/ Pbte Multilayers Determined By X-mentioning

confidence: 99%

Magnetic ordering of EuTe∕PbTe multilayers determined by x-ray resonant diffraction

Díaz

Granado

Abramof

et al. 2008

Applied Physics Letters

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In this work we use resonant x-ray diffraction combined with polarization analysis of the diffracted beam to study the magnetic ordering in EuTe∕PbTe multilayers. The presence of satellites at the (12 12 12) magnetic reflection of a 50 repetition EuTe∕PbTe superlattice demonstrated the existence of magnetic correlations among the alternated EuTe layers. The behavior of the satellites intensity as T increases toward the Nèel temperature TN indicates that these correlations persist nearly up to TN and suggests the preferential decrease of the magnetic order parameter of external monolayers of each EuTe layer within the superlattice.

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X-ray resonant magnetic scattering at L edges of 3d transition metals in multilayers

Cited by 17 publications

References 20 publications

Magnetic properties of bctFexMn1−xthin-film alloys investigated by linearly polarized soft-x-ray resonant magnetic

Magnetic properties of bctFexMn1−xthin-film alloys investigated by linearly polarized soft-x-ray resonant magnetic

X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

Magnetic ordering of EuTe∕PbTe multilayers determined by x-ray resonant diffraction

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