X-ray photoabsorption and total electron yield of Fe thin films at the L2,3 edge

Ufuktepe, Y.; Akgül, Güvenç; Lüning, J.

doi:10.1016/j.jallcom.2005.02.056

Cited by 14 publications

(16 citation statements)

References 14 publications

(33 reference statements)

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“…XAS spectra were recorded in TEY mode [18,19] with an energy resolution better than 100 meV. The beamline optics was tuned to reduce the photon flux density at the sample to avoid the effect of radiation damage, as already done in previous investigations [7].…”

Section: Methodsmentioning

confidence: 99%

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X‐Ray Magnetic Circular Dichroism Picks out Single‐Molecule Magnets Suitable for Nanodevices

et al. 2009

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Section: Methodsmentioning

confidence: 99%

“…The surface sensitivity of the Total Electron Yield (TEY) detection mode [18,19] was exploited to probe the first layer(s) of the two films. The XMCD spectra were obtained as the difference between the XAS spectra recorded for antiparallel (s À ) and parallel (s þ ) alignment of the photon helicity with respect to the applied magnetic field.…”

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confidence: 99%

X‐Ray Magnetic Circular Dichroism Picks out Single‐Molecule Magnets Suitable for Nanodevices

et al. 2009

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“…As a consequence, except for the few materials for which the sampling depth has been experimentally determined, the depth sensitivity of this technique is still under discussion. Previous studies on transition metals and rare earths showed a strong dependence of d on the investigated material, in the range 1.5 -2.5 nm for metallic Fe, Ni, Co, Dy and Tb for photon energies in the range 700 -900 eV [4,5,6,7,8,9]. Because of the different electronic structure between metals and insulators, in particular the gap in the density of states near the Fermi level in the latter that will influence the secondary electron cascade, insulators are expected to have a larger electron sampling depth.…”

Section: Introductionmentioning

confidence: 99%

Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

et al. 2014

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Knowledge of the electron sampling depth and related saturation effects is important for quantitative analysis of X-ray absorption spectroscopy data, yet for oxides with the perovskite structure no quantitative values are so far available. Here we study absorption saturation in films of two of the moststudied perovskites, La 0.7 Ca 0.3 MnO 3 (LCMO) and YBa 2 Cu 3 O 7 (YBCO), at the L 2,3 edge of Mn and Cu, respectively. By measuring the electron-yield intensity as a function of photon incidence angle and film thickness, the sampling depth d, photon attenuation length λ and the ratio λ/d have been independently determined between 50 and 300 K. The extracted sampling depth d LCMO ≈ 3 nm for LCMO at high temperatures in its polaronic insulator state (150 -300 K) is not much larger than values reported for pure transition metals (d Co or Ni ≈ 2 -2.5 nm) at room temperature, but is smaller than d YBCO ≈ 3.9 nm for metallic YBCO that is in turn smaller than the value reported for Fe 3 O 4 (d Fe3O4 ≈ 4.5 nm). The measured d LCMO increases to 4.5 nm when LCMO is in the metallic state at low temperatures. These results indicate that a universal rule of thumb for the sampling depth in oxides cannot be assumed, and that it can be measurably influenced by electronic phase transitions that derive from strong correlations.

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“…Because 3d L ‐edge XAS is based on dipole‐allowed transitions and involves the 2p 6 3d n to 2p 5 3d n + 1 transition, the spectral features are intense and dependent on the oxidation state, spin state, and local environment; the spectral features are also element specific . The L 2 (2p 1/2 ) and L 3 (2p 3/2 ) absorption edges in transition metals are strongly peaked and display ‘white lines’ corresponding to the transitions from 2p 1/2 and 2p 3/2 levels, respectively, to unoccupied 3d states of high density . The electronic structure of nickel has been subject to a wide range of studies.…”

Section: Introductionmentioning

confidence: 99%

Thickness and angular dependence of the L‐edge X‐ray absorption of nickel thin films

et al. 2011

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We report on the near‐edge X‐ray absorption fine structure spectroscopy of the L3 (2p3/2) and L2 (2p1/2) edges for ferromagnetic pure nickel transition metal and show that the L2,3 edge peak intensity and satellite feature at ~6 eV above the L3 edge in nickel increase with increasing nickel film thickness both in the total electron yield and transmission modes. The absorption spectra of nickel metal, however, exhibit strong angular‐dependent effects when measured in total electron yield mode. In addition, we calculated the mean electron escape depth of the emitted electrons (λe), which was found for pure nickel metal to be λe=25 ± 2 Å. We point out the advantages of the total electron yield technique for the study of the L‐edge of 3d transition metals. Copyright © 2011 John Wiley & Sons, Ltd.

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X-ray photoabsorption and total electron yield of Fe thin films at the L2,3 edge

Cited by 14 publications

References 14 publications

X‐Ray Magnetic Circular Dichroism Picks out Single‐Molecule Magnets Suitable for Nanodevices

X‐Ray Magnetic Circular Dichroism Picks out Single‐Molecule Magnets Suitable for Nanodevices

Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

Thickness and angular dependence of the L‐edge X‐ray absorption of nickel thin films

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