Thickness and angular dependence of the L‐edge X‐ray absorption of nickel thin films

Ufuktepe, Y.; Akgül, Güvenç; Aksoy, Funda; Nordlund, Dennis

doi:10.1002/xrs.1362

Cited by 14 publications

(12 citation statements)

References 30 publications

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“…The calculated Ni‐L 3 to L 2 ratio (ratio of the integrated intensities) is 3.1 and matches, within error bars, the one determined previously by EELS measurements of the VAN with 2.4 nm diameter wires. It is also in good agreement with values reported in the literature . This spectrum thus confirms the EELS data and, considering the surface sensitivity of the total electron yield (TEY) mode, also shows that an ultrathin AlO x capping layer can be efficiently used to prevent oxidation at the apex of the wires.…”

Section: Resultssupporting

confidence: 91%

“…Figure a shows the X‐ray absorption data of a Ni‐STO VAN containing nanowires with mean diameter d = 5 nm. The spectrum is very similar to those of earlier studies of bulk Ni, with an absence of spectral features related to nickel oxide formation. Note for example the presence of a broad satellite peak located 6 eV above the L 3 maximum, which has been reported in other studies on metallic Ni .…”

Section: Resultssupporting

confidence: 83%

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Atomic‐Scale Study of Metal–Oxide Interfaces and Magnetoelastic Coupling in Self‐Assembled Epitaxial Vertically Aligned Magnetic Nanocomposites

Radtke

Hennes

Bugnet

et al. 2019

Adv Materials Inter

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Vertically aligned nanocomposites (VANs) of metal/oxide type have recently emerged as a novel class of heterostructures with great scientific and technological potential in the fields of nanomagnetism, multiferroism, and catalysis. One of the salient features of these hybrid materials is their huge vertical metal/oxide interface, which plays a key role in determining the final magnetic and/or transport properties of the composite structure. However, in contrast to their well‐studied planar counterparts, detailed information on the structural features of vertical interfaces encountered in VANs is scarce. In this work, high resolution scanning transmission electron microscopy (STEM) and electron energy‐loss spectroscopy (EELS) are used to provide an element selective atomic‐scale analysis of the interface in a composite consisting of ultrathin, self‐assembled Ni nanowires, vertically epitaxied in a SrTiO3/SrTiO3(001) matrix. Spectroscopic EELS measurements evidence rather sharp interfaces (6–7 Å) with the creation of metallic NiTi bonds and the absence of nickel oxide formation is confirmed by X‐ray absorption spectroscopy measurements. The presence of these well‐defined phase boundaries, combined with a large lattice mismatch between the oxide and metallic species, gives rise to pronounced magnetoelastic effects. Self‐assembled columnar Ni:SrTiO3 composites thus appear as ideal model systems to explore vertical strain engineering in metal/oxide nanostructures.

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Section: Resultssupporting

confidence: 91%

Section: Resultssupporting

confidence: 83%

Atomic‐Scale Study of Metal–Oxide Interfaces and Magnetoelastic Coupling in Self‐Assembled Epitaxial Vertically Aligned Magnetic Nanocomposites

Radtke

Hennes

Bugnet

et al. 2019

Adv Materials Inter

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show abstract

“…However, the difference in the measurement depth is limited to one over the cosine of the incident angle from the normal of the sample. Some surface-sensitive measurements, such as TEY, are only well optimized for angles less than 60 from the normal of the sample (Ufuktepe et al, 2011), limiting the change in effective measuring depth to a factor of two. This factor of two difference might be sufficient for variation of surface valence, but not if the properties of a buried interface are the goal of the study.…”

Section: Figurementioning

confidence: 99%

Depth-dependent atomic valence determination by synchrotron techniques

Trappen

Zhou

Tra

et al. 2018

J Synchrotron Radiat

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The properties of many materials can be strongly affected by the atomic valence of the contained individual elements, which may vary at surfaces and other interfaces. These variations can have a critical impact on material performance in applications. A non-destructive method for the determination of layer-bylayer atomic valence as a function of material thickness is presented for La 0.7 Sr 0.3 MnO 3 (LSMO) thin films. The method utilizes a combination of bulkand surface-sensitive X-ray absorption spectroscopy (XAS) detection modes; here, the modes are fluorescence yield and surface-sensitive total electron yield. The weighted-average Mn atomic valence as measured from the two modes are simultaneously fitted using a model for the layer-by-layer variation of valence based on theoretical model Hamiltonian calculations. Using this model, the Mn valence profile in LSMO thin film is extracted and the valence within each layer is determined to within an uncertainty of a few percent. The approach presented here could be used to study the layer-dependent valence in other systems or extended to different properties of materials such as magnetism.

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“…Two pair of bands at 847.7/850.6 and 864.8/867.8 eV, with similar shapes and relative intensities, are observed in the spectra. The L edge XANES spectra of nickel compounds are composed by two signals due to spin-orbit coupling, L 3 (2p 3/2 ) and L 2 (2p 1/2 ), with a separation of 16 eV for Ni(0) [66,67]. In the present case the pair of bands are separated by 17.1/17.2 eV, and with relative intensities close to 2, indicating that corresponds to L 3 and L 2 transitions, respectively.…”

Section: X-ray Absorption Near Edge Structure (Xanes) Spectroscopymentioning

confidence: 99%

Electronic structure determination using an assembly of conventional and synchrotron techniques: The case of a xanthate complex

Juncal

Ávila

Asensio

et al. 2017

Spectrochimica Acta Part A: Molecular and Biomolecular Spectros

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The electronic properties of the coordination complex nickel (II) bis-n-propylxanthate, Ni(CH(CH)OC(S)S), were studied by a combination of complementary experimental (both laboratory and synchrotron based techniques) and theoretical methods. Energy differences between HOMOs and LUMOs were determined from UV-visible spectroscopy. The assignment of the transitions were performed with the aid of TD-DFT calculations and based in symmetry considerations. The analysis of the Raman excitation profiles of selected vibrational modes of the complex, taken in resonance with a particular electronic transition, was found to reinforce the electronic assignment. Experimental binding energies of inner and core electrons were determined by PES measurements. Ni K-edge, S K-edge, Ni L-edge, O K-edge and C K-edge XANES spectra were interpreted in terms of the promotion of core electrons to unoccupied electronic levels. An experimental quantitative molecular orbital diagram was constructed using the information extracted from the different techniques.

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Thickness and angular dependence of the L‐edge X‐ray absorption of nickel thin films

Cited by 14 publications

References 30 publications

Atomic‐Scale Study of Metal–Oxide Interfaces and Magnetoelastic Coupling in Self‐Assembled Epitaxial Vertically Aligned Magnetic Nanocomposites

Atomic‐Scale Study of Metal–Oxide Interfaces and Magnetoelastic Coupling in Self‐Assembled Epitaxial Vertically Aligned Magnetic Nanocomposites

Depth-dependent atomic valence determination by synchrotron techniques

Electronic structure determination using an assembly of conventional and synchrotron techniques: The case of a xanthate complex

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