2020
DOI: 10.1088/2040-8986/abc313
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X-ray multi-modal intrinsic-speckle-tracking

Abstract: We develop x-ray multi-modal intrinsic-speckle-tracking (MIST), a form of x-ray speckle-tracking that is able to recover both the position-dependent phase shift and the position-dependent small-angle x-ray scattering (SAXS) signal of a phase object. MIST is based on combining a Fokker–Planck description of paraxial x-ray optics, with an optical-flow formalism for x-ray speckle-tracking. Only two images need to be taken in the presence of the sample, corresponding to two different transverse positions of the sp… Show more

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Cited by 24 publications
(51 citation statements)
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“…This enables us to write down a directional-darkfield generalization of Eq. ( 1), namely the following anisotropic-diffusion forward-finite-difference Fokker-Planck speckle-tracking equation due to Pavlov et al [58]:…”
Section: Theorymentioning
confidence: 99%
See 3 more Smart Citations
“…This enables us to write down a directional-darkfield generalization of Eq. ( 1), namely the following anisotropic-diffusion forward-finite-difference Fokker-Planck speckle-tracking equation due to Pavlov et al [58]:…”
Section: Theorymentioning
confidence: 99%
“…More recently, another random-mask speckle-tracking approach was developed. This third approach is the Optical Flow (OF) method [56], together with its Fokker-Planck generalization (Multi-modal Intrinsic Speckle Tracking (MIST)) [57,58]. We now focus attention on this third method, which implicitly rather than explicitly tracks speckles.…”
Section: Introductionmentioning
confidence: 99%
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“…The Fokker-Planck equation may thus be viewed as the natural diffusive generalization of the TIE, which simultaneously models attenuation, phase and dark-field effects in PBI settings. The Fokker-Planck equation has been applied to grid/grating-based imaging in the context of the forward problem as seen in Morgan & Paganin [14], and has also been used to retrieve phase and dark-field signals in the context of the inverse problem applied to x-ray speckle-tracking [20], [21]. Both of these dark-field imaging techniques, as well as analyzerbased dark-field imaging, have the disadvantage of requiring extra hardware in the form of optical elements to extract phase and dark-field contrast.…”
Section: Introductionmentioning
confidence: 99%