2019
DOI: 10.1017/9781139924542
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X-ray Microscopy

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Cited by 38 publications
(40 citation statements)
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“…Confocal XRF (CXRF) microscopy allows spatial discrimination of XRF photons from a sample in all three dimensions. 71 CXRF employs overlapping focal regions of two X-ray optics-a condenser and collector-to directly probe a 3D volume in space. Although polycapillaries are the most common collection optics used for CXRF microscopy, they limit the technique to depth resolution of 10s of microns.…”
Section: Xrf Confocal Imagingmentioning
confidence: 99%
“…Confocal XRF (CXRF) microscopy allows spatial discrimination of XRF photons from a sample in all three dimensions. 71 CXRF employs overlapping focal regions of two X-ray optics-a condenser and collector-to directly probe a 3D volume in space. Although polycapillaries are the most common collection optics used for CXRF microscopy, they limit the technique to depth resolution of 10s of microns.…”
Section: Xrf Confocal Imagingmentioning
confidence: 99%
“…Regardless of whether we wish to use them in a full-field imaging microscope, to focus a beam to a small spot for a scanning microscope or to focus a short pulse to a small spot to achieve high intensities, the short focal-length lenses of these examples would bring several practical inconveniences. The field of view would be limited to a width that is comparable to the diameter of the lens [ 3 ] and the working distance limits the size of objects that can be examined in a tomographic setting. The lens must be positioned near the source or to an image of that source, where the beam size matches the diameter of the lens, placing high demands on the beamline design and optics.…”
Section: Introductionmentioning
confidence: 99%
“…Here, we examine achromat and apochromat designs to focus short-wavelength X-rays for imaging modalities such as scanning Compton X-ray microscopy [ 15 , 16 ], scanning fluorescence microscopy [ 3 ], ptychography [ 17 ] and projection imaging [ 18 ]. The achievable exposure times of these schemes are usually limited by the available flux that can be focused in a small spot, which could be significantly increased by the ability to accept a larger bandwidth from the source (such as the full width of a harmonic of an undulator device at a modern synchrotron radiation facility).…”
Section: Introductionmentioning
confidence: 99%
“…In this work, we focus on sample preparation mainly used in X-ray microscopy (Jacobsen, 2019), especially nano-tomography in the multi-keV energy range. Many existing techniques, such as focused ion-beam milling Young & Moore, 2005), laser microdissection (Nelson et al, 2006) as well as mechanical cutting using an ultramicrotome (Wanner et al, 2015;Dykstra, 1992), can be used to reduce the dimensions of a sample.…”
Section: Introductionmentioning
confidence: 99%