X-ray imaging detectors for synchrotron and XFEL sources

Hatsui, Takaki; Graafsma, H.

doi:10.1107/s205225251500010x

Cited by 83 publications

(55 citation statements)

References 47 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The synchrotron small angle X‐ray scattering (SAXS) measurements were performed for the samples that remained on the FSC sensor. The diffraction patterns of WAXS were acquired using a charge‐integration type detector named SOPHIAS (RIKEN, Japan), which has a detector plane of 26.40 mm × 63 mm and pixel resolution of 30 μm × 30 μm . Pilatus 1 M (DECTRIS) detector systems were used for SAXS.…”

Section: Methodsmentioning

confidence: 99%

Isothermal crystallization kinetics, morphology, and crystalline structure of polypropylene/poly(4‐methyl‐1‐pentene) blends

Furushima

Nakada

Masuda

et al. 2020

Polymer Crystallization

View full text Add to dashboard Cite

The isothermal crystallization kinetics of polypropylene (PP) in poly(4‐methyl‐1‐pentene) blends were investigated by comparing the blend results with those of the PP homopolymer. Fast scanning calorimetry‐optical microscope studies were carried out to determine the crystallization rate and microscale morphology during crystallization from the highly supercooled liquid. The crystallization rate of the blend system was faster than that of the PP homopolymer at temperatures between 50°C and 90°C. Synchrotron small angle X‐ray scattering and transmission electron microscopy results showed that there were no differences in the thickness of lamellar PP or nanoscale PP morphology between the homopolymer and polymer blends. Wide angle X‐ray scattering data revealed that the content ratio of the PP α form and the conformational disordered PP phase did not change between both samples. However, the crystalline lattice size of PP decreased in the blend systems. The increment of crystallization kinetics of the blend system is explained by a Gibbs free energy diagram.

show abstract

Section: Methodsmentioning

confidence: 99%

Isothermal crystallization kinetics, morphology, and crystalline structure of polypropylene/poly(4‐methyl‐1‐pentene) blends

Furushima

Nakada

Masuda

et al. 2020

Polymer Crystallization

View full text Add to dashboard Cite

show abstract

“…Photon energies are limited to 25-30 keV due to the dramatic decrease of the efficiency of silicon-based sensors for higher energies. High-Z hybrid pixel photon counting detectors open the way towards efficient measurements at much higher energies [14], but their commercialization has started only recently.…”

Section: Experimental Techniquesmentioning

confidence: 99%

In-between Bragg reflections: thermal diffuse scattering and vibrational spectroscopy with x-rays

Bosak

Chernyshov

Wehinger

et al. 2015

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

In the last decade diffuse scattering studies re-gained their place in the domain of lattice dynamics studies. The use of thermal diffuse scattering becomes particularly efficient when coupled with vibrational spectroscopy, where inelastic x-ray scattering can be advantageous compared to inelastic neutron scattering, and state-of-the-art ab initio calculations. We present a brief summary of the experimental and theoretical background, give an overview of the principle experimental implementations, and discuss a representative set of examples of such a combined approach.

show abstract

“…2), we used a 512 Â 512 hybrid pixel detector capable of direct X-ray detection. It is based on a Medipix-2 chip developed at CERN and bonded to a 300 mm-thick Si sensor (Hatsui & Graafsma, 2015). Placing the detector at about 500 mm from the sample covers only a 3 Â 3 solid angle.…”

Section: Methodsmentioning

confidence: 99%

“…The experiment utilizes developments in synchrotron source optics (Kirkpatrick & Baez, 1948), two-dimensional X-ray pixel detectors (Hatsui & Graafsma, 2015) and elaborated evaluation procedures.…”

Section: Introductionmentioning

confidence: 99%

Measurement of synchrotron-radiation-excited Kossel patterns

Bortel¹,

Faigel²,

Tegze³

et al. 2016

J Synchrotron Rad

View full text Add to dashboard Cite

Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensitivity that limits the spatial extent of the structural information. To obtain the atomic structure in bulk volumes, X-rays should be used as the excitation radiation. However, there are technical problems, such as the need for high resolution, low noise, large dynamic range, photon counting, twodimensional pixel detectors and the small spot size of the exciting beam, which have prevented the widespread use of Kossel pattern analysis. Here, an experimental setup is described, which can be used for the measurement of Kossel patterns in a reasonable time and with high resolution to recover structural information.

show abstract

X-ray imaging detectors for synchrotron and XFEL sources

Cited by 83 publications

References 47 publications

Isothermal crystallization kinetics, morphology, and crystalline structure of polypropylene/poly(4‐methyl‐1‐pentene) blends

Isothermal crystallization kinetics, morphology, and crystalline structure of polypropylene/poly(4‐methyl‐1‐pentene) blends

In-between Bragg reflections: thermal diffuse scattering and vibrational spectroscopy with x-rays

Measurement of synchrotron-radiation-excited Kossel patterns

Contact Info

Product

Resources

About