X-ray diffraction (XRD) profile analysis of pure ECAP-annealing Nickel samples

Abstract

X-Ray Diffraction (XRD) profile of pure equal channel angular pressing (ECAP)-annealing nickel samples has been thoroughly investigated for studying the material structures changes that imply to the mechanical behavior. Nickel-based material can be used for several applications such as biomaterial, gear, and some part of the instrument at nuclear facilities, which require high-grade standard material properties. ECAP is one kind of severe plastic deformation (SPD) techniques to obtain excellent mechanical properties without adding another element. However, the ECAP process generates metastable structures due to some mismatch structure and inhomogeneous stress within the material. This problem can usually be resolved by annealing after the ECAP process. In this article, pure Nickel was processed by ECAP at 423 K for two passes. The post-ECAP annealed will be carried out at the temperature range from 298 K until 1373 K. The microhardness test results indicate that the ECAP process increases the microhardness significantly, which remains stable after annealing until 773 K. At higher annealing temperature, the mechanical properties will drop suddenly and reach the microhardness value of pure pre-ECAP Nickel. This behavior could be explained clearly by the XRD data analysis result, which shows similar behavior structure changes. XRD data initially show peak shifting to lower 2θ value, which indicates an expansion to a higher lattice parameter, then at the higher annealing temperature, the diffraction peaks split gradually. This peak splitting could be indexed as pure pre-ECAP Ni peaks, which could be related to the drop of the microhardness value.

Asymmetric Oxo‐Bridged ZnPb Bimetallic Electrocatalysis Boosting CO2‐to‐HCOOH Reduction

“…X‐ray diffraction (XRD) measurements confirmed the Zn(Pb) structure to include metallic Zn, although the (002), (100), and (101) peaks are shifted toward higher angles and split with increasing Pb content, [ 31 ] as shown in Figure a. This trend refers to the compression and tension [ 32 ] of Zn phases due to the embedded Pb atoms supported by the XRD simulation presenting a similar pattern, as shown in Figure S1 in the Supporting Information. The presence of lead in Zn(Pb) films is unambiguously confirmed using X‐ray photoelectron spectroscopy (XPS) (Figure 1b; Figure S2, Supporting Information).…”

Development of La and Mo Co-Doped SrTiO3 as Novel Anode Material for Solid Oxide Fuel Cell Applications

“…3, the sample with x = 0.02 has a single perovskite structure, but the sample with x = 0.05 has a trace amount of pyrochlore phase (La 2 Ti 2 O 7 ) and the sample with x = 0.07 contains a minor impurity phase (MoO 3 ) in addition to the pyrochlore phase. However, as the Mo concentration increased, the XRD peak of the samples [11]. This is because the ionic radii of dopant element of La 3+ (1.36 Å) are substantially bigger than the other dopant element of Mo 6+ (0.590 Å).…”

Heterogeneous microstructure and mechanical behaviour of Al-8.3Fe-1.3V-1.8Si alloy produced by laser powder bed fusion

“…The decreasing lattice constant of the S350 sample may result from the higher solid solution of Fe, V, and Si atoms in the Al matrix of the S350 sample. This phenomenon could be supported by the lower intensity of the Al x (Fe, V) y Si phase in the S350 sample than that in the S200 sample (Uesugi and Higashi 2013;Prasetya, Muhammad Rifai, and Miyamoto 2020).…”