2012
DOI: 10.1016/j.matlet.2012.07.098
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X-ray diffraction line profile analysis of chemically synthesized lead sulphide nanocrystals

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Cited by 33 publications
(7 citation statements)
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References 13 publications
(21 reference statements)
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“…The crystal plane (2 0 0) is the prominently seen in the XRD pattern. This is in agreement with the report of [8]. The prominent peak in the XRD pattern corresponds to the galena, (PbS) mineral in the galena ore sample as other mineralogical content of the ore could be sphalerite (ZnS), Pyrite (FeS2), Chalcopyrite (CuFeS2), etc.…”
Section: 4 X-ray Diffraction Characterizationsupporting
confidence: 92%
“…The crystal plane (2 0 0) is the prominently seen in the XRD pattern. This is in agreement with the report of [8]. The prominent peak in the XRD pattern corresponds to the galena, (PbS) mineral in the galena ore sample as other mineralogical content of the ore could be sphalerite (ZnS), Pyrite (FeS2), Chalcopyrite (CuFeS2), etc.…”
Section: 4 X-ray Diffraction Characterizationsupporting
confidence: 92%
“…δ values for all the PbS films were larger than zero, suggesting that the crystal faces were under transverse tensile stress parallel to the interface. Nanoparticle strain was mainly induced by edge dislocations [31]. Changes in film stress with C Pb and C S affected the absorption of PbS films in the near-infrared region.…”
Section: Crystalline Structure and Surface Morphologymentioning
confidence: 99%
“…Nanostructured materials have been a great attraction for the scientific and technological world in the contemporary times due to their unique properties and applications in various fields [1][2][3]. In the modern research, preparation and study of nanoparticles is very essential.…”
Section: Introductionmentioning
confidence: 99%