1999
DOI: 10.1016/s0925-8388(99)00184-x
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X-ray diffraction and microstructural study of PFM precious metal dental alloys under different metallurgical conditions

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Cited by 8 publications
(3 citation statements)
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“…SEM and EDX measurements were made. From the XRD patterns, the crystal symmetry and cell parameters of the samples were obtained by computer-interfaced advanced diffractometer Bruker AXS D8 XRD [17][18][19][20][21][22]. This machine is measuring between angular ranges 0 o < 2 < 90 o with using Bragg-Brentano geometry.…”
Section: Determination Of Microstructurementioning
confidence: 99%
“…SEM and EDX measurements were made. From the XRD patterns, the crystal symmetry and cell parameters of the samples were obtained by computer-interfaced advanced diffractometer Bruker AXS D8 XRD [17][18][19][20][21][22]. This machine is measuring between angular ranges 0 o < 2 < 90 o with using Bragg-Brentano geometry.…”
Section: Determination Of Microstructurementioning
confidence: 99%
“…From the XRD patterns, the crystal symmetry and cell parameters of the samples were determined [16][17][18][19][20][21].The microstructures of the samples were characterized using a LEO 440 SEM equipped with an EDX spectrometer as well as a computer-controlled image analyzer. The Al, Pb, and Sn compositions of the samples were determined using the EDX technique.…”
Section: Microstructure Measurementsmentioning
confidence: 99%
“…The samples were cut transversely into ~3-5 mm long sections and then grounded for the electrical conductivity measurements [16][17][18][19][20]. The temperature of the sample was adjusted by a controllable Nabertherm furnace and measured using a 0.5 mm standard K type thermocouple which was placed very close to the sample and detected with the Keithley 2700 multimeter.…”
Section: Electrical Conductivity Measurementmentioning
confidence: 99%