2004
DOI: 10.1023/b:jmsc.0000016202.96505.51
|View full text |Cite
|
Sign up to set email alerts
|

X-ray diffraction analysis of the defect structure in AlxGa1 - xN films grown by metalorganic chemical vapor deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2005
2005
2013
2013

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 10 publications
0
2
0
Order By: Relevance
“…In this study, full width at half maximum (FWHM) of 2h diffraction angle is used to qualitatively characterize the defect density including deformation shear bands and twins, 36,37 which affect the martensite volume fraction. As reported by Olson and Cohen, 17 the intersection of deformation shear bands are considered as available nucleation sites where martensite growth is possible to occur.…”
Section: B Effect Of Laser Intensity On Martensite Formationmentioning
confidence: 99%
“…In this study, full width at half maximum (FWHM) of 2h diffraction angle is used to qualitatively characterize the defect density including deformation shear bands and twins, 36,37 which affect the martensite volume fraction. As reported by Olson and Cohen, 17 the intersection of deformation shear bands are considered as available nucleation sites where martensite growth is possible to occur.…”
Section: B Effect Of Laser Intensity On Martensite Formationmentioning
confidence: 99%
“…Thus, in order to evaluate the crystallinity, we have plotted the lateral grain size and the mean grain size of the columnar-structured (Zn 0.93 Mn 0.07 )O thin films as a function of the growth temperature. The lateral grain size was determined from SEM images, and the mean grain size was calculated by Scherer's equation [24]. The grain size of the crystal, L, can be estimated from the relation given by…”
Section: Resultsmentioning
confidence: 99%