X-Ray Diffraction Analysis of Liquid Hg, Sn, Zn, Al and Cu

Vahvaselkä, K S

doi:10.1088/0031-8949/18/4/005

Cited by 25 publications

(12 citation statements)

References 28 publications

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“…Compared with those in Figure 5, the unresolved static (311) and (400) diffraction lines in Figure 6 are observed at larger scattering angles due to the longer wavelength x-rays. Again, we observe a broad interference peak in the dynamic-minus-static image near the center of the detector's field of view, with the location and width of the peak in good agreement with the static liquid tin diffraction experiments of Vahvaselkä 21 as shown in Figure 6b.…”

Section: Single-pulse Xrd Experimentssupporting

confidence: 85%

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Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum

Морган

Macy

Stevens

2008

Review of Scientific Instruments

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a) Author to whom correspondence should be addressed. Electronic mail: morgandv@nv.doe.gov.A new, fast, single-pulse x-ray diffraction (XRD) diagnostic for determining phase transitions in shocked polycrystalline materials has been developed. The diagnostic consists of a 37-stage Marx bank high-voltage pulse generator coupled to a needle-andwasher electron beam diode via coaxial cable, producing line and bremsstrahlung x-ray emission in a 35-ns pulse. The characteristic K α lines from the selected anodes of silver and molybdenum are used to produce the diffraction patterns, with thin foil filters employed to remove the characteristic K β line emission. The x-ray beam passes through a pinhole collimator and is incident on the sample with an approximately 3-mm by 6-mm spot and 1° full-width-half-maximum (FWHM) angular divergence in a Bragg-reflecting geometry. For the experiments described in this report, the angle between the incident beam and the sample surface was 8.5°. A Debye-Scherrer diffraction image was produced on a phosphor located 76 mm from the polycrystalline sample surface. The phosphor image was coupled to a charge-coupled device (CCD) camera through a coherent fiberoptic bundle. Dynamic single-pulse XRD experiments were conducted with thin foil samples of tin, shock loaded with a 1-mm vitreous carbon back window. Detasheet high explosive with a 2-mm-thick aluminum buffer was used to shock the sample. Analysis of the dynamic shock-loaded tin XRD images revealed a phase transformation of the tin beta phase into an amorphous or liquid state. Identical experiments with shock-loaded aluminum indicated compression of the face-centered-cubic (fcc) aluminum lattice with no phase transformation.

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Section: Single-pulse Xrd Experimentssupporting

confidence: 85%

“…The broad peak in our image is compared to a static liquid tin XRD experiment performed by Vahvaselkä [21] in Figure 5b. The agreement of the width and location of the broad interference peak leads to the conclusion that the shock-loaded tin has transformed to an amorphous or liquid state.…”

Section: Single-pulse Xrd Experimentsmentioning

confidence: 99%

Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum

Морган

Macy

Stevens

2008

Review of Scientific Instruments

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“…The X-ray apparatus was a vertical 0-0 diffractometer with a primary-beam crystal (LiF-200) monochromator and a solid state (SiLi) detector (more detailed description is given in the previous work [4]).…”

Section: Methodsmentioning

confidence: 99%

Total and Partial Interference Functions, Radial Atomic Distributions, and Electrical Resistivities for Liquid Indium and Liquid Gallium-Indium Alloys

Vahvaselkä

1982

phys. stat. sol. (a)

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X‐ray scattering intensities are measured on liquid In and Ga–In alloys and the liquid structure factor S(K) for In and the total interference functions I(K) for Ga–In alloys are determined from the observed data, and these results further used for a radial distribution analysis in this paper. The weighted interatomic distance r1 and the average coordination number n for the alloys show positive deviations from the linear (Vegard's law) dependence on concentration. Approximate partial interference functions for Ga–In alloys are calculated and used then in a resistivity calculation according to Faber and Ziman. A comparison with the observed resistivities of Roll and Swamy indicates that the calculated values are in reasonable agreement with the observed ones in a wide concentration range.

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“…Many x-ray- [10][11][12] and neutron [13][14][15] diffraction investigations of l-Sn have been carried out. Although quite scattered, diffraction data just above the melting point always show the characteristic hump after the first S(k) peak.…”

Section: Andmentioning

confidence: 99%

Multiple-edge EXAFS refinement: Short-range structure in liquid and crystalline Sn

Cicco

1996

Phys. Rev. B

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L-edge extended x-ray-absorption fine structure (EXAFS) spectra of solid and liquid tin have been collected by using synchrotron radiation. Information on local structure has been obtained by simultaneous analysis of Sn L(3)-, L(2)-, and L(1)-edge EXAFS spectra by using an original data-analysis scheme based on the nb initio multiple-scattering GNXAS method. The use of the three edges allowed the extension of the energy range of the useful data increasing the accuracy of the derived structural parameters. Details of the multiple-edge data-analysis methodology are provided. The general interest of the method for multiple-edge structural studies of monatomic and multiatomic systems is discussed. A very good agreement with diffraction data is found for crystalline Sn. The first-neighbor distribution is studied as a function of temperature. Statistical errors on the structural parameters are provided. The model pair distribution function g(r) obtained by x-ray-diffraction data is refined in liquid Sn at T=245 degrees C. The EXAFS structural signal is shown to be very sensitive to the short-range correlations. The foot of the first peak of the g(r) is found to be steeper and the mean distance is found slightly shorter than previously indicated. Error bars on the g(r), due to random errors in the EXAFS data, are also shown. The signature of a three-body signal assigned to short-range covalent tetrahedral configurations is evidenced

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X-Ray Diffraction Analysis of Liquid Hg, Sn, Zn, Al and Cu

Abstract: X-Ray diffraction analysis o f liquid

Cited by 25 publications

References 28 publications

Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum

Real-time x-ray diffraction measurements of shocked polycrystalline tin and aluminum

Total and Partial Interference Functions, Radial Atomic Distributions, and Electrical Resistivities for Liquid Indium and Liquid Gallium-Indium Alloys

Multiple-edge EXAFS refinement: Short-range structure in liquid and crystalline Sn

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