The temperature dependences of the intensity and the long spacing in X-ray small-angle scattering for quenched, r-ray irradiated and well annealed poly-(oxymethylene)s were measured over a range of temperature from -120°C to the neighbourhood of the melting point. In a range of temperature below 40°C, the temperature dependence of the peak intensity is due to the difference of the density between the crystalline and the amorphous layers for all samples. Observation of the change of the thermal expansion coefficient in the amorphous layer in the vicinity of -75°C gives direct evidence of glass transition. However, above 40°C the temperature dependence of the intensity can not be explained in terms of the density difference. Above 120°C, partial melting takes place for a well annealed sample and the long spacing increases slightly. On the other hand, for a quenched sample, the annealing effect arises from 120°c.
KEY WORDSX-ray / Small-angle Scattering / Glass Transition / Melting/ Annealing Effect/ Poly(oxymethylene) /