1958
DOI: 10.1021/ac50163a005
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X-Ray Absorption and Emission

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Cited by 16 publications
(7 citation statements)
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References 24 publications
(33 reference statements)
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“…XRF spectrometry soon became an instrumental analytical technique for elemental analysis – preferably for heavier elements. In 1958, elements with atomic numbers lower than 22 Ti were referred to as light and thus problematic elements, yet industrial analyses of chlorine were reported already . Henke brought XRF analyses of low atomic number elements from phosphorus to sodium into the range of routine when he published his achievements in soft X‐ray spectrographic analyses of these particular elements in 1962 .…”
Section: Introductionmentioning
confidence: 99%
“…XRF spectrometry soon became an instrumental analytical technique for elemental analysis – preferably for heavier elements. In 1958, elements with atomic numbers lower than 22 Ti were referred to as light and thus problematic elements, yet industrial analyses of chlorine were reported already . Henke brought XRF analyses of low atomic number elements from phosphorus to sodium into the range of routine when he published his achievements in soft X‐ray spectrographic analyses of these particular elements in 1962 .…”
Section: Introductionmentioning
confidence: 99%
“…At least partial compensation for matrix absorption effects can be obtained by the use of an added internal standard (8). Such standards also compensate in some degree for enhancement effects and for some instrument variables (1).…”
Section: Discussionmentioning
confidence: 99%
“…The procedures developed for these determinations were complicated by absorption effects due to variations in the composition of the matrix. Com- (8) Hiickel, W., "Structural Chemistry of Inorganic Compounds," p. 592, Elsevier, New York, 1951. (9) Jahoda, F. C., Phys.…”
Section: Recentlymentioning
confidence: 99%
“…These films may be a preconcentrated trace element, a thin layer representative of a large sample, or a metallic coating deposited on a substrate. Regardless of the film's origin, the principles for relating intensitv to concentration are well established (274,(276)(277)(278).…”
Section: Coatingsmentioning
confidence: 99%
“…A discussion of x-ray mass absorption coefficients is included in the section on electron probe microanalysis. Previous reviews (276)(277)(278), recent general papers (139, 155, 198-201, 207, 473), and the following analytical applications adequately summarize x-ray absorption: sulfur in oil (163,154,185,373), chlorine in organic compounds (192), cobalt in hydrocarbons (373) and in aqueous solutions (198), plutonium in metal castings (267), TBP in kerosine-base solvents (146), composition of solders (339), lead and barium in glass (339), and evaluation of column-chromatographic separation of iodineand bromine-containing compounds (340). Instrument development includes single-crystal (253) and double-crystal spectrometers (240), the latter having a multisample changer.…”
mentioning
confidence: 99%