Williamson–Hall study on synthesized nanocrystalline tungsten carbide (WC)

Singla, Gourav; Singh, K.; Pandey, O.P.

doi:10.1007/s00339-012-7531-0

Cited by 42 publications

(22 citation statements)

References 17 publications

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“…This method was first proposed by Williamson and Hall [77] and has been applied to various nanoparticle systems. [78][79][80][81] The Williamson-Hall analysis method described earlier gives values for the crystallite size and strain that are averaged over all crystallographic directions. In some cases, this may not be appropriate.…”

Section: X-ray Diffractionmentioning

confidence: 99%

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X-ray scattering characterisation of nanoparticles

Ingham

2015

Crystallography Reviews

138

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This article provides, in tutorial style, a review of X-ray scattering methods commonly used to characterise nanoparticles and gives numerous case studies of basic science and industrial applications right up to the present. It is divided into two major sections, broadly covering Xray diffraction and small-angle X-ray scattering. Each section begins with a brief introduction to the technique and the information that can be obtained by using it, followed by a discussion on experimental considerations, with a particular focus on nanoparticle characterisation. The techniques and analysis methods are demonstrated by way of examples of a wide variety of nanoparticle materials and synthesis methods. Recent advances in related techniques such as anomalous scattering and pair distribution function analysis are also described and discussed.

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Section: X-ray Diffractionmentioning

confidence: 99%

“…[80] They obtained a crystallite size of 37.1 nm and a uniform strain of 2.36 × 10 −3 . The crystallite size was in good agreement with the particle size obtained from TEM observations.…”

Section: Ex Situ Xrd Analysis On Other Systemsmentioning

confidence: 99%

X-ray scattering characterisation of nanoparticles

Ingham

2015

Crystallography Reviews

138

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“…Three different models, that is, Uniform Deformation Model (UDM), Uniform Stress‐Deformation Model (USDM), and Uniform Deformation Energy Density Model (UDEDM) of the Williamson‐Hall analysis are used to calculate the structural parameters. The detailed description of the X‐Ray Line Profile Analysis is published elsewhere …”

Section: Resultsmentioning

confidence: 99%

In situ single‐step reduction and silicidation of MoO₃ to form MoSi₂

2018

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Nanocrystalline molybdenum disilicide (MoSi2) is synthesized in a specially designed autoclave at 900°C. The XRD results revealed that the formation of MoSi2 is favorable with the blend of MoO3, Si, and Mg powders. The HR‐TEM and SAED patterns confirm the formation of MoSi2 phase. The structural parameters (crystallite size, strain, stress, and deformation energy density) are calculated using the Williamson‐Hall (W‐H) analysis. The formation mechanism involved in the synthesis of MoSi2 is proposed. The nonisothermal oxidation kinetics (~1200°C) of MoSi2 phase is examined through the thermal analysis techniques. The activation energy is determined by the Kissinger‐Akahira‐Sunsose isoconversional kinetic model. Finally, the reaction mechanism involved during the oxidation of MoSi2 phase is identified using the integral master‐plots method.

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“…To apply Scherrer method healthily, calculation of FWHM accurately is important [17]. Bragg peak patterns gained from HR-XRD analyses is dependent on both device and sample effects.…”

Section: Particle Size Calculation According To Scherrer Methodsmentioning

confidence: 99%

“…W-H model is not dependent on 1/cosθ as in Scherrer model but it changes with Tanθ. This basic difference is used for distinguishing micro-strain and reflection broadening [17]. Strain is caused from imperceptivity of the crystal and separation.…”

Section: Particle Size Calculation According To W-h Methodsmentioning

confidence: 99%

On the elastic properties of INGAN/GAN LED structures

et al. 2019

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In this study, three InGaN/GaN light-emitting diode (LED) structures with five periods are investigated grown by metal organic chemical vapor deposition (MOCVD) technique. During growth of these three samples, active layer growth temperatures are adjusted as 650, 667 and 700 °C. These structures are grown on sapphire (Al 2 O 3 ) wafer as InGaN/GaN multiquantum wells (MQWs) between n-GaN and p-AlGaN + GaN contact layers. During growth, pressure and flux ratio of all sources are kept constant for all samples. Only temperature of InGaN active layer is changed. These structures are analyzed with high-resolution X-ray diffraction (HR-XRD) technique. Their surface morphologies are investigated with atomic force microscopy (AFM). Reciprocal space mapping (RSM) is made different from classical HR-XRD analyses. Using this method, mixed peaks belonging to InGaN, AlGaN and GaN layers are seen more clearly and their full width at half maximum (FWHM) values is determined with better accuracy. With FWHM gained from RSM and Williamson-Hall (W-H) method based on universal elastic coefficients of the material, particle size D (nm), uniform stress σ (GPa), strain ε and anisotropic energy density u (kJ m −3 ) parameters for the samples are calculated. The results are compared with literature. On the other hand, to have an idea about the accuracy of the results AFM images are examined. Parameters calculated showed differences but it is seen that the largest particle size is gained for GaN and the smallest is gained for AlGaN. For all parameters, it is seen that they increase for GaN layer and decrease for AlGaN layer with increasing temperature. For InGaN layer parameters, they showed both increasing and decreasing or decreasing and increasing behavior harmonically with an increase in temperature. Results showed that they are compatible with literature. Results gained from Scherrer and W-H are very near to each other.

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Williamson–Hall study on synthesized nanocrystalline tungsten carbide (WC)

Cited by 42 publications

References 17 publications

X-ray scattering characterisation of nanoparticles

X-ray scattering characterisation of nanoparticles

In situ single‐step reduction and silicidation of MoO₃ to form MoSi₂

On the elastic properties of INGAN/GAN LED structures

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Williamson–Hall study on synthesized nanocrystalline tungsten carbide (WC)

Cited by 42 publications

References 17 publications

X-ray scattering characterisation of nanoparticles

X-ray scattering characterisation of nanoparticles

In situ single‐step reduction and silicidation of MoO3 to form MoSi2

On the elastic properties of INGAN/GAN LED structures

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Product

Resources

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In situ single‐step reduction and silicidation of MoO₃ to form MoSi₂