Wideband Modeling of CMOS Schottky Barrier Diode Detectors for THz Radiometry

Abstract

A complete system modeling and characterization of a wideband differential THz direct detector, integrated in a commercial CMOS technology, is presented. The detector consists of a recently developed double leaky slot lens antenna that operates from 200 GHz to 600 GHz in combination with a differential Schottky Barrier Diode (SBD) direct detection circuit. The proposed methodology, starting from low frequency measurements on a standalone SBD, is able to adequately model the spectral radiometric performance. The system Noise Equivalent Power (NEP) is characterized from 325 GHz to 500 GHz in excellent agreement with the proposed system model. The measured NEP, 20 pW/ √ Hz minimum and 90 pW/ √ Hz frequency averaged, is compromised w.r.t. the average NEP of 2.7 pW/ √ Hz that was initially predicted by simulations using the process design kit (PDK) model, since the available SBDs are operating beyond their cut-off frequency. The diodes and models provided by the PDK proved to be inaccurate in predicting circuit behavior at these high frequencies. By using the proposed analysis and modeling approaches, an accurate wideband antenna-detector co-design could be applied for future passive THz imaging applications based on CMOS technologies.