2019
DOI: 10.1017/s1431927619002812
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What Lies Beneath: 3D vs 2D Correlative Imaging Challenges and How to Overcome Them

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Cited by 5 publications
(9 citation statements)
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“…In this step, a ‘targeted slice’ was chosen from the XRM data, and from that a known amount of sample surface material (measured using the XRM scan images) can be removed. This is achieved via grinding and polishing of the sample surface 73 , and in our case, 574 µm (Fig. 3 ) needed to be removed to expose the targeted region.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…In this step, a ‘targeted slice’ was chosen from the XRM data, and from that a known amount of sample surface material (measured using the XRM scan images) can be removed. This is achieved via grinding and polishing of the sample surface 73 , and in our case, 574 µm (Fig. 3 ) needed to be removed to expose the targeted region.…”
Section: Methodsmentioning
confidence: 99%
“…The resin block was frequently measured using a Hilka digital calliper to ensure the correct thickness of sample was removed. Further details on this manual correlative sample preparation method can be found in 73 . Our results were within 20 µm of the targeted slice (i.e., 554 µm was removed), so a new XRM slice was chosen for the following image correlation to match the newly exposed surface (Fig.…”
Section: Methodsmentioning
confidence: 99%
“…In this step, a 'targeted slice' was chosen from the XRM data, and from that a known amount of sample surface material (measured using the XRM scan images) can be removed. This is achieved via grinding and polishing of the sample surface 68 , and in our case, 574 µm (Fig. 3) needed to be removed to expose the targeted region.…”
Section: -Intermediate Correlative Microscopy Sample Preparation Stepmentioning
confidence: 99%
“…The resin block was frequently measured using a Hilka digital calliper to ensure the correct thickness of sample was removed. Further details on this manual correlative sample preparation method can be found in 68 . Our results were within 20 µm of the targeted slice (i.e., 544µm was removed), so a new XRM slice was chosen for the following image correlation to match the newly exposed surface (Fig.…”
Section: -Intermediate Correlative Microscopy Sample Preparation Stepmentioning
confidence: 99%
“…Common issues with traditional approaches are either high initial investment into sophisticated, dedicated instruments or problematic image correlation due to data incompatibility (data formats, pixel count and size, etc.) between devices used [7]. LiteScope is equipped with Correlative Probe and Electron Microscopy (CPEM)™ technology that enables simultaneous data acquisition and correlation of multiple channels; for example, the material contrast given by SEM is merged with the 3D topography of surface features obtained by AFM, resulting in a 3D CPEM view (Figure 1).…”
Section: Introductionmentioning
confidence: 99%