AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis

Novotná, Veronika; Horak, Josef; Konečný, Martin; Hegrová, Veronika; Novotný, Ondřej; Novacek, Z.; Neuman, Jan

doi:10.1017/s1551929520000875

Cited by 14 publications

(10 citation statements)

References 13 publications

(13 reference statements)

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Section: Nanoindentation and Micropillar Compression Testmentioning

confidence: 99%

“…Figure 4b shows a platinum‐carbon 3D architecture before and after the nanoindentation on top. Recently, an AFM‐in‐SEM setup had been proposed by Novotna et al [ 82 ] Such a setup allowed the exploitation of the imaging capabilities of the two techniques, while an indenter performed the mechanical testing. This hybrid technique combined sample phase identification, precise indentation targeting, and topographical analysis into a single measurement, allowing for comprehensive characterization, as shown in Figure 4c.…”

Section: Nanoindentation and Micropillar Compression Testmentioning

confidence: 99%

“…Nanoindentation Hardness and elastic modulus Thin films Guillonneau et al [80] Viscoelastic response 3D architecture Lewis et al [81] Phase identification Bulk Novotna et al [82] Micropillar compression test…”

Section: Measurements Samples Referencesmentioning

confidence: 99%

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In Situ Nanomechanical Characterization Techniques for Soft Bioelectronic Interfaces and Their Building Blocks

Cortelli,

Cramer,

Patruno

et al. 2023

Adv Materials Technologies

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Soft bioelectronic interfaces constitute a paradigm shift for biomedical devices. High‐resolution monitoring and stimulation of physiological processes in vivo are becoming possible with minimally invasive devices operated without inflicting tissue damage or discomfort over prolonged timescales. However, the development and commercialization of such interfaces still must address significant challenges. Biological tissue is subjected to continuous motion and the related device deformations can easily trigger fracture or delamination of the device components, putting long‐term durability of soft implants at risk. In this review, an overview of experimental techniques for testing mechanical properties and failure mechanisms of soft bioelectronic devices at the nanoscale while the deformation takes place (in situ) is provided. Through the tensile test, bending test, nanoindentation, and micropillar compression test, precise measurements of the mechanical properties of individual building blocks and the interfaces themselves can be obtained. Such parameters are crucial to design, model, and optimize the device's performance. Then, recent examples of how this information guides design and optimization of soft bioelectronic interfaces and devices for healthcare, robotics, and human–machine interfaces is provided. Last of all, future research that is needed to fully achieve long‐term soft bioelectronic interfaces for integration with the human body is discussed.

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Section: Nanoindentation and Micropillar Compression Testmentioning

confidence: 99%

Section: Nanoindentation and Micropillar Compression Testmentioning

confidence: 99%

See 1 more Smart Citation

In Situ Nanomechanical Characterization Techniques for Soft Bioelectronic Interfaces and Their Building Blocks

Cortelli,

Cramer,

Patruno

et al. 2023

Adv Materials Technologies

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“…Although the CLEM, acronym for Correlative Light to Electron Microscopy, has been the first to be developed in the 60s [2,3], still retains a central role for its immediate impact on the medical and life sciences [1]. Nevertheless, over the last years, new combinations of different microscopy and spectroscopy techniques started to emerge, including instruments like Atomic Force Microscopy (AFM) or Raman spectroscopy [4,5], bringing many companies to develop a series of new tools that combine them together, like the RISE system, born from the partnership between Zeiss and WITec [6], with the aim to construct an integrated Raman and Scanning Electron Microscopy (SEM) instrument, or the Litescope AFM-in-SEM from Nenovision [7,8], capable to perform several AFM techniques inside the chamber of an electron microscope. These new devices allow not only to perform a combined analysis without transferring the sample from an instrument to another, resulting not only in a enormous time saving, but above all in a more precise and controlled workflow.…”

Section: Introductionmentioning

confidence: 99%

Influence of the conductive coating on combined CPEM and Raman analysis.

Mura,

Dinarelli,

Mancini

et al. 2023

J. Phys.: Conf. Ser.

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The sample preparation is one of the fundamental steps to obtain a successful correlative microscopy experiment, and for non-conductive materials the deposition of a thin metal coating is often mandatory for a good SEM observation. Nevertheless, in case of correlative experiment, where AFM and Raman spectroscopy are involved in the workflow, this deposition will have a direct influence on both the analysis. In this paper, an investigation about the most common conductive materials used in SEM sample preparation, such as chromium, graphite and gold, and their behaviour in the construction of correlative microscopy workflow is proposed, showing in our results, that chromium is the best choice for this type of combined analysis.

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“…Then, from the overlapping of these two images, it is possible to obtain a final CPEM image that condensate on the very same area, all the information typical of the SEM imaging with the real height values measured with the AFM. However, it is worth mentioning that the AFM can be used not only to measure the height, but also others specific physical properties such as local elasticity or local conductivity [9]. In this paper, we used Raman spectroscopy, AFM and SEM to characterize two different samples of moonmilk, a particular type of nanostructured calcium carbonate, sampled from ancient tombs of the Etruscan Necropolis of Tarquinia [10,11].…”

Section: Introductionmentioning

confidence: 99%

Comparison of different correlative AFM-SEM workflows on calcite moonmilk

Dinarelli

Mura²,

Mancini³

et al. 2022

IOP Conf. Ser.: Mater. Sci. Eng.

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In recent years, high resolution microscopy techniques are evolving toward a fast combination of different microscopies and spectroscopies, generally labelled under the title of correlative microscopy, each capable to provide unique information and a more comprehensive characterization of the sample under analysis. Among them stands out the Correlative Probe to Electron Microscopy (CPEM), where Scanning Electron Microscopy and Scanning Probe Microscopy are combined. This kind of technique is relatively new, and its range of capabilities is still not fully explored. In this paper, a demonstration of different CPEM workflows to characterize the moonmilk, a particular type of nanostructured calcium carbonate, extracted from ancient tombs of the Etruscan Necropolis of Tarquinia, is provided. Besides, the advantages of an innovative AFM-in-SEM setup, even respect to the standard standalone AFM measurement, are presented, showing how the analysis of the moonmilk nano-fibers, a rather challenging sample to be analysed with probe microscopies, is simplified and with less risk of artefacts or contamination of the AFM probe.

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AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis

Abstract: Abstract

Cited by 14 publications

References 13 publications

In Situ Nanomechanical Characterization Techniques for Soft Bioelectronic Interfaces and Their Building Blocks

In Situ Nanomechanical Characterization Techniques for Soft Bioelectronic Interfaces and Their Building Blocks

Influence of the conductive coating on combined CPEM and Raman analysis.

Comparison of different correlative AFM-SEM workflows on calcite moonmilk

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