What can the ABCD parameters tell us about the TRL?

Reynoso-Hernández, J.A.; Pulido-Gaytan, M. A.; Maya-Sanchez, M. C.; Loo‐Yau, J. R.

doi:10.1109/arftg79.2012.6291201

Cited by 12 publications

(12 citation statements)

References 7 publications

(9 reference statements)

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“…At present, vector network analyzers (VNAs) allowing access to the instrument receivers are used as the vector receiver (VR) in load-pull systems (Figure 2a). Thus, VNA calibration techniques, such as the thru-reflect-line (TRL) [20][21][22], thru-reflect-match (TRM) [23,24], and short-open-load with unknown thru (SOLT) [25] may be used to carry out the relative calibration of VRLP systems. This calibration relates ratioed quantities measured at the VR (U1-U2 planes), to ratioed quantities at the calibration plane (D1-D2 planes), as depicted in Figure 2b.…”

Section: Relative Calibrationmentioning

confidence: 99%

Advances in Microwave Large-Signal Metrology: From Vector-Receiver Load-Pull to Vector Signal Network Analyzer and Time-Domain Load-Pull Implementations (Invited Paper)

et al. 2022

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Radiofrequency (RF) power amplifiers (PAs) are important elements of modern communication systems. The most important components in PAs are the transistors, which are operated under large-signal regimes in such applications. Designing and optimizing PAs are challenging tasks that demand the highest accuracy on large-signal measurements at both device and circuit levels. Large-signal power transistor characterization demands the development and utilization of high-frequency and low-frequency load-pull systems. Furthermore, the static and dynamic characterization of two-input PAs requires the development of new measurement systems that consist of an nonlinear vector network analyzer (NVNA) and an arbitrary waveform generators (AWG). This paper reviews the research activities, achievements, and current research goals at CICESE Research Center in Mexico in the large-signal microwave metrology field.

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Section: Relative Calibrationmentioning

confidence: 99%

Advances in Microwave Large-Signal Metrology: From Vector-Receiver Load-Pull to Vector Signal Network Analyzer and Time-Domain Load-Pull Implementations (Invited Paper)

et al. 2022

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“…The calculation is based on ABCD parameters [21]. Following the same approach, the matrices "Thru" (T) and "Line" (L) are defined as: with:…”

Section: Trl Theory With Abcd Matricesmentioning

confidence: 99%

Applied TRL Calibration Technique Using ABCD Matrices for Bended Access Ports

Arafat¹,

Abderahim²,

Nabil³

et al. 2021

CJAST

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Calibrating network analyzer is still an issue for bended access port devices (devices with access). Bended accesses can give additional errors which are taken into account by using a new design standards of Vector Network Analyzer (VNA) calibration. This Thru-Reflect-Line calibration technique is computed from ABCD parameters that easily allow to remove the bended port effects. This approach is based on the assumption that the Vector Network Analyzer error boxes can be considered as passive system. Furthermore, the method can be applied for de-embedding devices with bended accesses. This calibration and de-embedding technique could be applied, for example, to a coplanar circulator or a power divider measurement which have access lines at 120° from each other.

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“…When using the 8-term error model, a two-port VNA measures the matrix product 978-1-4799-8887-7/15/$31.00 ©2015 IEEE representing the measured and the actual behavior of a DUT, respectively. According to [9], the ABCD parameters matrix of a uniform transmission line having length lL, propagation constant γ and characteristic impedance ZL may be diagonalized and expressed as 1…”

Section: Overview Of the Lzz Calibration Proceduresmentioning

confidence: 99%

On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures

Pulido-Gaytan

Reynoso-Hernández

Maya-Sanchez

et al. 2015

2015 85th Microwave Measurement Conference (ARFTG)

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This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) calibration technique in the small-signal characterization of devices mounted in coaxial-to-microstrip test fixtures. The usefulness of the LZZ calibration in such application is verified by comparing the Sparameters of a GaN-HEMT packaged transistor corrected using the LZZ with those corrected using the thru-reflect-line (TRL) calibration technique.

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What can the ABCD parameters tell us about the TRL?

Cited by 12 publications

References 7 publications

Advances in Microwave Large-Signal Metrology: From Vector-Receiver Load-Pull to Vector Signal Network Analyzer and Time-Domain Load-Pull Implementations (Invited Paper)

Advances in Microwave Large-Signal Metrology: From Vector-Receiver Load-Pull to Vector Signal Network Analyzer and Time-Domain Load-Pull Implementations (Invited Paper)

Applied TRL Calibration Technique Using ABCD Matrices for Bended Access Ports

On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures

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