2016
DOI: 10.1364/oe.24.005311
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Wavelength scanning interferometry using multiple light sources

Abstract: A novel sensing method is proposed for wavelength scanning interferometry using multiple tunable light sources. As it is well known, a deterioration of depth resolution usually occurs when multiple phase intervals, corresponding to the multiple tunable light sources, are used for distance measurement purposes. It is shown here, that it is possible to regain depth resolution characteristics of a complete scan by means of a temporal phase unwrapping extrapolation method. With the proposed method, the resulting p… Show more

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Cited by 15 publications
(11 citation statements)
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“…and after the Fourier transform of Eq. 3, and except for a negligible zero order factor, we obtain equivalent equations to those obtained in wavelength scanning interferometry: 12 IðÃÞ…”
Section: Interference Using Compound Prisms In a Mach-zehnder Interfementioning
confidence: 85%
See 1 more Smart Citation
“…and after the Fourier transform of Eq. 3, and except for a negligible zero order factor, we obtain equivalent equations to those obtained in wavelength scanning interferometry: 12 IðÃÞ…”
Section: Interference Using Compound Prisms In a Mach-zehnder Interfementioning
confidence: 85%
“…The virtual interferogram is sampled at regular intervals δx according to x=x0+nδx, where n is an integer, now defining the phase slope as and after the Fourier transform of Eq. 3, and except for a negligible zero order factor, we obtain equivalent equations to those obtained in wavelength scanning interferometry: 12 except that now the variable Λ is now related to the phase slope, W depends on the coherence degree, and the spatial dimensions of the illuminated interference area is sampled by the projection of the camera detector of length w onto the virtual plane. The phase should not change by more than π between successive x samples.…”
Section: Interference Using Compound Prisms In a Mach–zehnder Interfementioning
confidence: 93%
“…[11][12][13] Depending on the difference of measurement principles, the 3D shape metrology of measuring specular surfaces can be classified as contact method 14 and noncontact method. [15][16][17][18][19][20][21][22][23][24][25][26][27][28] The coordinate measurement machine (CMM) 14 is a superior choice for measuring specular surfaces by touching the measured surface and scanning along two-dimensional (2D) directions in contact method. Although CMM has the drawbacks of high cost, low speed, and scratching of the surface, 29 it is still the most widely used method for specular surface measurement because touch probes are highly accurate for dimensional inspection.…”
Section: Introductionmentioning
confidence: 99%
“…A reference is normally required for interferometry; therefore, it is hard to measure complicated aspheric mirrors or free-form specular objects. White light interferometry [ 16 ], wavelength scanning interferometer [ 17 ] and multiple wavelength interferometer [ 18 ] can be used to measure specular objects having discontinuous surfaces. However, the field of view of the objective lens, the range of the scanner and the limited synthetic wavelength are restricted to the measurement range.…”
Section: Introductionmentioning
confidence: 99%