Wavelength-Dispersive Total Reflection X-Ray Fluorescence  with High-Brilliance Undulator Radiation at SPring-8

Awaji, N.; Ozaki, Shinji; Nishino, Junichi; Noguchi, Sinichi; Yamamoto, Tohru; Syoji, Takashi; Yamagami, Motoyuki; Kobayashi, Akira; Hirai, You; Shibata, Masahiro; Yamaguchi, Koji; Liu, Kuang-Yu; Kawado, Seiji; Takahashi, Mamoru; Yasuami, S.; Konomi, Ichiro; Kimura, Shigeru; Hirai, Yasuharu; Hasegawa, Masaki; Komiya, Satoshi; Hirose, Takayuki; Okajima, Toshihiro

doi:10.1143/jjap.39.l1252

Cited by 16 publications

(6 citation statements)

References 6 publications

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“…Synchrotron radiation based X-ray fluorescence (SR-XRF) and total reflection X-ray fluorescence (SR-TXRF) techniques are the examples of such trends, where parts per trillion (ppt) level or, in absolute mass, femto gram detection sensitivities have been achieved. [22][23][24] Normally, XRF techniques are comparative in nature and type-standards are generally used to calibrate the spectrometers. Similarly, synthetic standards are employed to determine the DLs.…”

Section: Introductionmentioning

confidence: 99%

Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry

2005

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Section: Introductionmentioning

confidence: 99%

Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry

2005

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“…The first time use of a wavelength dispersive spectrometer in a TXRF arrangement was reported by Awaji et al 135 This was carried out at the SPring-8 Beamline BL16XU, which is the most brilliant source currently available and is, therefore, highly suitable for the exploitation of the WD technique. The reported detection limits for metallic impurities on silicon wafer surfaces were 10 9 atoms cm 22 or 100 fg in absolute mass.…”

Section: Total Reflection X-ray Fluorescence Spectrometry (Txrf)mentioning

confidence: 99%

Atomic Spectrometry Update. X-ray fluorescence spectrometry

Potts

Ellis

Kregsamer³

et al. 2001

J. Anal. At. Spectrom.

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Reviews 2 Instrumentation 2.1 General instrumentation and excitation sources 2.2 Detectors 3 Spectrum evaluation, matrix correction and calibration procedures 3.1 Spectrum evaluation 3.2 Matrix correction and calibration procedures 4 X-ray optics 5 Synchrotron radiation 6 Total reflection X-ray fluorescence spectrometry (TXRF) 7 Portable and mobile XRF 8 On-line XRF 9 Applications 9.1 Sample preparation 9.2 Preconcentration techniques 9.3 Geological 9.4 Environmental 9.5 Archaeological and forensic 9.6 Industrial 9.7 Clinical and biological 9.8 Thin films 9.9 Chemical state analysis and speciationThis annual review of X-ray fluorescence covers developments over the period 2000-2001 in instrumentation and detectors, matrix correction and spectrum analysis software, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. During the current review period, publications have demonstrated the development of sub-100 nm X-ray beams for SR microprobe analysis together with the wider use of WD spectrometers in this application. There is evidence of an extension of the application of XRF as a reference technique, with XRF increasingly being used in modern laboratories in place of older wet-chemical methods, and computer-modelling studies continue to be popular in extending the understanding of various XRF phenomena. Some interesting work has been undertaken in the measurement of radiative Auger effects using high-resolution WDXRF instruments. However, the potential for future developments in XRF is illustrated by research into ultra-high resolution microcalorimeter detector devices, which are still at the experimental stage and have not yet progressed to the status of useful practical devices.

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“…In total reflection X‐ray fluorescence (TXRF) analysis, monochromatic excitation effectively reduces the spectral background originating from air, a sample holder and the sample itself, and monochromatic X‐rays from a high power X‐ray source are usually used to improve detection limits. By using a monochromatic synchrotron radiation, detection limits in the femtogram range (1 fg = 10 −15 g) were achieved. On the other hand, we have developed portable TXRF spectrometers using white X‐rays (i.e., continuum X‐rays and characteristic X‐rays or continuum X‐rays from an X‐ray tube) from a 1–5 W X‐ray tube.…”

Section: Introductionmentioning

confidence: 99%

Trace elemental determination by portable total reflection X‐ray fluorescence spectrometer with low wattage X‐ray tube

Kunimura

Kawai

2013

X-Ray Spectrometry

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A specimen containing nanograms of Sb, rare earth elements, Pb, and Bi and a specimen containing a few nanograms each of As and Pb were measured using a portable total reflection X-ray fluorescence spectrometer. Nanograms of Sb, rare earth elements, Pb, and Bi were detected. Although the As Ka line (10.54 keV) overlapped with the Pb La line (10.55 keV) in a spectrum of the specimen containing nanograms of As and Pb, the Pb Lb line was detected. Therefore, the net intensity of the As Ka line was calculated using the Pb La/Lb intensity ratio in a spectrum of a Pb standard solution and the net intensity of the Pb Lb line in the spectrum of the specimen containing As and Pb. This result indicates that these two elements can be quantified by using the portable spectrometer. Commercially available bottled drinking water was also measured. The portable spectrometer detected several tens of ppb of V in the drinking water sample.

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Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8

Cited by 16 publications

References 6 publications

Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry

Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry

Atomic Spectrometry Update. X-ray fluorescence spectrometry

Trace elemental determination by portable total reflection X‐ray fluorescence spectrometer with low wattage X‐ray tube

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