1993
DOI: 10.1007/bf02198156
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VUV-photoelectron spectroscopy on lead clusters deposited from the pulsed arc cluster ion source (PACIS)

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Cited by 22 publications
(9 citation statements)
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“…The most prevalent continuous ionization sources used for ion soft landing include electron impact ionization (EI) (Pradeep et al, ; Biesecker et al, ; Wijesundara et al, ; Bottcher et al, ), electrospray ionization (ESI) (Feng et al, ; Ouyang et al, ; Alvarez et al, ; Volny & Turecek, ; Mazzei et al, ; Hamann et al, ; Hauptmann et al, ), direct current (DC) or radiofrequency (RF) magnetron sputtering combined with gas aggregation (Haberland et al, , , ; Barnes et al, ; Pratontep et al, ; Tanemura et al, ; Lim et al, ; Duffe et al, ; Watanabe & Isomura, ; Gracia‐Pinilla et al, ; Nielsen et al, ; Wepasnick et al, ; Hartmann et al, ; Ludwig & Moore, ; Yin et al, ), high energy ion sputtering (Lapack et al, ; Harbich et al, ; Dong et al, ; Bromann et al, ; Fedrigo et al, ; Schaffner et al, ; O'Shea et al, ; Yamaguchi et al, ; Lau et al, ), and gas condensation/aggregation (GC) (Patil et al, ; Goldby et al, ; Yoon et al, ; Baker et al, ). Soft landing has also been accomplished using various pulsed ionization methods including matrix‐assisted laser desorption ionization (MALDI) (Rader et al, ), laser ablation/vaporization (Honea et al, ; Messerli et al, ; Pauwels et al, ; Klingeler et al, ; Heiz & Bullock, ; Melinon et al, ; Kemper et al, ; Mitsui et al, ; Winans et al, ; Cattaneo et al, ; Kaden et al, ; Davila et al, ; Tournus et al, ; Wepasnick et al, ; Woodward et al, ), the pulsed arc cluster ion source (PACIS) (Siekmann et al, ; Kaiser et al, …”
Section: Overview Of Instrumentation For Soft Landing Of Ionsmentioning
confidence: 99%
“…The most prevalent continuous ionization sources used for ion soft landing include electron impact ionization (EI) (Pradeep et al, ; Biesecker et al, ; Wijesundara et al, ; Bottcher et al, ), electrospray ionization (ESI) (Feng et al, ; Ouyang et al, ; Alvarez et al, ; Volny & Turecek, ; Mazzei et al, ; Hamann et al, ; Hauptmann et al, ), direct current (DC) or radiofrequency (RF) magnetron sputtering combined with gas aggregation (Haberland et al, , , ; Barnes et al, ; Pratontep et al, ; Tanemura et al, ; Lim et al, ; Duffe et al, ; Watanabe & Isomura, ; Gracia‐Pinilla et al, ; Nielsen et al, ; Wepasnick et al, ; Hartmann et al, ; Ludwig & Moore, ; Yin et al, ), high energy ion sputtering (Lapack et al, ; Harbich et al, ; Dong et al, ; Bromann et al, ; Fedrigo et al, ; Schaffner et al, ; O'Shea et al, ; Yamaguchi et al, ; Lau et al, ), and gas condensation/aggregation (GC) (Patil et al, ; Goldby et al, ; Yoon et al, ; Baker et al, ). Soft landing has also been accomplished using various pulsed ionization methods including matrix‐assisted laser desorption ionization (MALDI) (Rader et al, ), laser ablation/vaporization (Honea et al, ; Messerli et al, ; Pauwels et al, ; Klingeler et al, ; Heiz & Bullock, ; Melinon et al, ; Kemper et al, ; Mitsui et al, ; Winans et al, ; Cattaneo et al, ; Kaden et al, ; Davila et al, ; Tournus et al, ; Wepasnick et al, ; Woodward et al, ), the pulsed arc cluster ion source (PACIS) (Siekmann et al, ; Kaiser et al, …”
Section: Overview Of Instrumentation For Soft Landing Of Ionsmentioning
confidence: 99%
“…The most direct method to investigate the electronic level structure is photoelectron spectroscopy (PES). PES on clusters has a long history, comprising systems grown at surfaces [2,3], deposited from beams [4][5][6][7] and in gas phase. The latter yielded a fundamental understanding of how the electronic structure develops when the number of atoms N changes.…”
Section: Introductionmentioning
confidence: 99%
“…A variety of collision experiments between clusters and solid surfaces were performed during the last decades. These can be grouped into investigations involving (i) surface modification by cluster bombardment or deposition [1,2], (ii) scattering of intact species and their fragments [3,4], and (iii) electron emission [5][6][7]. Such studies gave, for instance, insight into the stability of small particles and, to a certain extent, their geometry; energetic cluster impact can modify the formation of thin films.…”
Section: Femtosecond Neutralization Dynamics In Cluster-solid Surfacementioning
confidence: 99%
“…(2) and (3) by taking into account 20 surface states for HOPG and 200 for Al, distributed in such a way as to reproduce the major features of the DOS of the targets. For simplicity, we use rectangular DOS of different width W , depending on the target material, but more states and more complicated DOS can be taken into account.…”
Section: Femtosecond Neutralization Dynamics In Cluster-solid Surfacementioning
confidence: 99%