2004
DOI: 10.1023/b:jach.0000009923.35223.f8
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Voltammetric and Raman microspectroscopic studies on artificial copper pits grown in simulated potable water

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Cited by 62 publications
(67 citation statements)
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“…In the spectra are observed two broad peaks centred almost at 525 cm -1 and 625 cm -1 which are unambiguously related to cuprous oxide, cuprite (Cu 2 O), in according to the Raman reference spectrum for cuprous oxide and the spectrum bands. 13,14 Likewise, this result accords with the copper corrosion products reported for the water-copper system where the oxides film have been mostly composed by cuprous oxide. 1,10 Electrochemical impedance spectroscopy at OCP .…”
Section: Copper Surface Characterizationsupporting
confidence: 89%
“…In the spectra are observed two broad peaks centred almost at 525 cm -1 and 625 cm -1 which are unambiguously related to cuprous oxide, cuprite (Cu 2 O), in according to the Raman reference spectrum for cuprous oxide and the spectrum bands. 13,14 Likewise, this result accords with the copper corrosion products reported for the water-copper system where the oxides film have been mostly composed by cuprous oxide. 1,10 Electrochemical impedance spectroscopy at OCP .…”
Section: Copper Surface Characterizationsupporting
confidence: 89%
“…For theset ypes of corrosion experiments,t he onset of the initial passivation typically occurs at variable potentials over several hundred millivolts because of the randomness of the individual micropitting events, and it has been shown that the dissolution largely proceeds with two electrons through the oxidation of Cu 0 to Cu 2 + . [41] Similar voltammetric responses wereo bserved for Cu electrodes modified with different amountso ft he MWCNTcoating solution ( Figure 1, colored lines), although much smaller oxidation peaks were obtained for electrodes modified with 10 drops, indicating that very high loadings of CNTsr educed the corrosion processes. The decrease in corrosion currents at very high loadings could either be attributedt ot he reduced access of the SO 4 2À anionst ot he Cu surfaceo rt othe reduced ability of corrosion products to be transported away from the electrode surface, thereby supporting electrode passivation.…”
Section: Voltammetric Behavior Of Copper Electrodes Modified With Porsupporting
confidence: 57%
“…The sulfate anion is known to be very aggressive in voltammetrically inducing copper dissolution, which leads to the formation of deep pits and reduces passivation events. [41] Althoughc opperi sdifferent to the carbon materials that are usually used for the base electrode, for the purposes of this study it is assumed that attachment of the MWCNTs occurs in as imilar manner.T his is ar easonablea s- www.chemelectrochem.org sumption ast he drop-casting procedure of CNTs( or most other carbon nanomaterials) does not produce ac ovalently bondedattachment, but one where the materialsticks through weak physisorption interactions. Furthermore, there was no evidencet hat the MWCNTsd etached from the copper electrode when placed in an electrolyte solution after the dropcasting procedure.…”
Section: Introductionmentioning
confidence: 99%
“…The molecule contains nitrogen atoms and it is also useful in preventing copper staining and tarnishing [5]. The electropolishing process reported to be inhibited with different ratio by the addition of some organic aldehydes [6]and Organic compounds containing polar groups, including nitrogen, sulfur, oxygen, and heterocyclic compounds with polar functional groups and conjugated double bonds have been reported to inhibit copper corrosion [7][8][9][10][11][12][13]. The inhibiting action of these organic compounds is usually attributed to their interactions with the copper surface via their adsorption.…”
Section: Introductionmentioning
confidence: 99%