2015
DOI: 10.1039/c4ta05161k
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Visualizing order in dispersions and solid state morphology with Cryo-TEM and electron tomography: P3HT : PCBM organic solar cells

Abstract: Document VersionPublisher's PDF, also known as Version of Record (includes final page, issue and volume numbers)Please check the document version of this publication:• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the … Show more

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Cited by 25 publications
(27 citation statements)
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References 59 publications
(68 reference statements)
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“…Therefore, to independently address the intensity of the PCBM peak at 0.217 Å –1 and the P3HT peak at 0.256 Å –1 , the spectrum was fitted to a model function by least-squares fitting. This function contains (in the same order as in eq 1) a Gaussian describing the PCBM peak, a Gaussian describing the P3HT peak, a Gaussian located between 0.285 and 0.323 Å –1 describing (inseparable) secondary components of both P3HT and PCBM, 28,31 a power law to estimate the inelastic background, and a constant representing residual dark current in the diffraction patterns. The variables a 1 and a 2 describe the intensity of the PCBM and P3HT signal, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, to independently address the intensity of the PCBM peak at 0.217 Å –1 and the P3HT peak at 0.256 Å –1 , the spectrum was fitted to a model function by least-squares fitting. This function contains (in the same order as in eq 1) a Gaussian describing the PCBM peak, a Gaussian describing the P3HT peak, a Gaussian located between 0.285 and 0.323 Å –1 describing (inseparable) secondary components of both P3HT and PCBM, 28,31 a power law to estimate the inelastic background, and a constant representing residual dark current in the diffraction patterns. The variables a 1 and a 2 describe the intensity of the PCBM and P3HT signal, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…We then study the nanostructures of these double‐cable polymers by using TEM measurements. Cryo‐TEM was initially used to study biomacromolecules, and in recent years it was also applied into polymer materials [14] and even conjugated polymers [15] . For conjugated polymers, high‐energy electrons cause radiolysis which generates radicals, most likely from side‐chain scission.…”
Section: Resultsmentioning
confidence: 99%
“…We then study the nanostructures of these double-cable polymers by using TEM measurements.C ryo-TEM was initially used to study biomacromolecules,a nd in recent years it was also applied into polymer materials [14] and even conjugated polymers. [15] For conjugated polymers,h igh-energy electrons cause radiolysis which generates radicals,m ost likely from side-chain scission. These radicals diffuse around and destroy the crystal structure,r esulting in the loss of visibility of lattice fringes and diffraction rings with increasing electron dose.T EM observation at cryogenic temperatures has been shown to prevent the diffusion of radicals and increase the critical dose for damage-free TEM observation by an order of magnitude.F or these observations,t he dose was maintained at half the reported critical dose for conjugated polymers.…”
Section: Methodsmentioning
confidence: 99%
“…Среди различных методов изучения наноструктуры фотоактивных слоев одними из наиболее широко приме-няемых методов являются атомно-силовая микроскопия (АСМ) и просвечивающая электронная микроскопия (ПЭМ) [5][6][7][8][9]. Два данных метода дают комплементар-ную информацию о наноструктуре образца, так как АСМ является методом для изучения поверхности и ПЭМ да-ет информацию о проекции объемной структуры.…”
Section: Introductionunclassified