The article presents results of geomorphometric modeling of the nanotopography based on measurements by atomic force microscopy (AFM). As initial data, we used measurements of the surface of a PTB7:PC 71 BM photovoltaic blend sample. The size of the analyzed scanning area of the sample was 2 x 2 μm; the elevation difference of the sample was 109 nm. A digital elevation model (DEM) of the sample included 66,049 points (a matrix 257 x 257); a DEM grid spacing was 7.8 nm. For geomorphometric modeling, we applied a universal spectral analytical method using Chebyshev polynomials and Fejér summation. We derived digital models and maps of twelve morphometric variables of the complete system of curvatures, such as: horizontal, vertical, difference, horizontal excess, vertical excess, accumulation, ring, minimum, maximum, mean, Gaussian curvatures and unsphericity, as well as curvedness and shape indices. Geomorphometric modeling and analysis of the nanotopography measured by AFM make it possible to reveal subtle nanotopographic inhomogeneities that are not displayed on the original DEM maps.